Abstract:
An arbitration circuit to arbitrate an issue between a read/write command and a scan command and a display driver integrated circuit including the arbitration circuit. The arbitration circuit includes a latch unit having a first latch circuit that latches and outputs a first signal related to a scan command and a second latch circuit that latches and outputs a second signal related to a read/write command, wherein the latch unit resets outputs of the first latch circuit and/or the second latch circuit in response to a ready signal related to a memory operation, and a maintaining unit to receive outputs of the first latch circuit and the second latch circuit, to generate a first internal signal to activate a scanning operation and a second internal signal to activate a reading/writing operation, maintain the first internal signal and the second internal signal, and to selectively activate the first internal signal or the second internal signal by changing the state of at least one of the first internal signal and second internal signal in response to the reset operation.
Abstract:
An arbitration circuit to arbitrate an issue between a read/write command and a scan command and a display driver integrated circuit including the arbitration circuit. The arbitration circuit includes a latch unit having a first latch circuit that latches and outputs a first signal related to a scan command and a second latch circuit that latches and outputs a second signal related to a read/write command, wherein the latch unit resets outputs of the first latch circuit and/or the second latch circuit in response to a ready signal related to a memory operation, and a maintaining unit to receive outputs of the first latch circuit and the second latch circuit, to generate a first internal signal to activate a scanning operation and a second internal signal to activate a reading/writing operation, maintain the first internal signal and the second internal signal, and to selectively activate the first internal signal or the second internal signal by changing the state of at least one of the first internal signal and second internal signal in response to the reset operation.
Abstract:
A semiconductor device having a sense amplifier driver with a capacitor affected by off current is provided. The sense amplifier driver, which receives a clock signal and generates a sense amplifier enable signal by buffering the clock signal, includes a plurality of inverters connected in series and at least one capacitor. A PMOS transistor of at least a first inverter of the plurality of inverters is connected between a dummy bit line, in which voltage drop by the off current is generated, and the output terminal of the first inverter and the at least one capacitor is connected between the dummy bit line and the output terminal of a second inverter which inverts an output signal of the first inverter. Therefore, the capacitance of the at least one capacitor is determined by voltage of the dummy bit line. Therefore, since the voltage drop of the dummy bit line is larger when the magnitude of the off current is larger, the capacitance of the at least one capacitor is larger. Therefore, active timing of the sense amplifier enable signal is determined according to the capacitance of the capacitor.
Abstract:
A structure and method of connecting a plurality of PSC-I beams (PSC-I beams) to each other using steel brackets. The beam connecting structure, each having a sheath pipe therein, includes an end plate which is mounted on each of both ends of each of the PSC-I beams, with a through hole provided on an upper portion of the end plate to correspond to the sheath pipe embedded in each of the PSC-I beams; a steel bracket integrally which is provided on the end plate to be perpendicular to the end plate; a bracket coupling plate to integrally couple the aligned steel brackets to each other; a bottom connecting plate which is provided on lower ends of the aligned steel brackets to connect the steel brackets to each other; a connecting sheath pipe which is provided between the PSC-I beams so that both ends of the connecting sheath pipe are respectively inserted into the through holes of the neighboring end plates of the PSC-I beams while the PSC-I beams are arranged linearly; a prestress strand which is inserted in the sheath pipes of the PSC-I beams and the connecting sheath pipe; and a concrete part which is filled in a space between the PSC-I beams to embed the aligned steel brackets, the bracket coupling plate and the connecting sheath pipe in the concrete part.
Abstract:
A semiconductor device having a sense amplifier driver with a capacitor affected by off current is provided. The sense amplifier driver, which receives a clock signal and generates a sense amplifier enable signal by buffering the clock signal, includes a plurality of inverters connected in series and at least one capacitor. A PMOS transistor of at least a first inverter of the plurality of inverters is connected between a dummy bit line, in which voltage drop by the off current is generated, and the output terminal of the first inverter and the at least one capacitor is connected between the dummy bit line and the output terminal of a second inverter which inverts an output signal of the first inverter. Therefore, the capacitance of the at least one capacitor is determined by voltage of the dummy bit line. Therefore, since the voltage drop of the dummy bit line is larger when the magnitude of the off current is larger, the capacitance of the at least one capacitor is larger. Therefore, active timing of the sense amplifier enable signal is determined according to the capacitance of the capacitor.