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公开(公告)号：US10783815B2
公开(公告)日：2020-09-22
申请号：US16307748
申请日：2018-09-12
Inventor： Meihong Wang , Peiqian Tong
Abstract: A testing apparatus and a testing method for a display panel. The testing apparatus includes a microcontroller unit (MCU) module; an electrical monitoring module, a power supply module, and a field programmable gate array (FPGA) module that are connected to the MCU module; a user interface (UI) display module; an optical monitoring module connected to the UI display module; and a gate driver on array (GOA) signal processing module and a digital-to-analog converter (DAC) module that are connected to the FPGA module. The power supply module, the GOA signal processing module, the DAC module, the electrical monitoring module, and the optical monitoring module are connected to a to-be-tested display panel.
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2.发明授权公开(公告)号：US10204965B2
公开(公告)日：2019-02-12
申请号：US15518479
申请日：2017-03-13
Inventor： Peiqian Tong
IPC: H01L27/12 , H01L27/32 , H01L51/50 , H01L51/52 , H01L51/56 , G09G3/3208 , H01L27/142
Abstract: The present disclosure relates to an OLED display panel, including: a thin-film transistor (TFT) array substrate, wherein the TFT array substrate includes a plurality of pixel areas arranged in a matrix and a non-pixel area configured to be outside of the pixel areas, at least one pixel structure formed on the TFT array substrate, wherein each of the pixel structure corresponds to one pixel area, and an organic photovoltaic formed on the corresponding non-pixel area. The present disclosure further relates a manufacturing method of the OLED display panel, including: providing a TFT substrate defined with a plurality of pixel areas and a non-pixel area; forming at least one pixel structure on the pixel areas by adopting a first mask plate to apply a thin film deposition process; forming an organic photovoltaic on the non-pixel area by adopting a second mask plate to apply the thin film deposition process.
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