公开(公告)号：US08514298B2

公开(公告)日：2013-08-20

申请号：US12657704

申请日：2010-01-26

Applicant: Vahid Ordoubadian

Inventor： Vahid Ordoubadian

IPC: H04N5/76

CPC classification number: H04N5/23229 ,  H04N1/2112 ,  H04N1/32149 ,  H04N5/357 ,  H04N5/361 ,  H04N5/367 ,  H04N5/772 ,  H04N5/913 ,  H04N9/045 ,  H04N9/8042 ,  H04N2005/91335 ,  H04N2101/00 ,  H04N2201/0084 ,  H04N2201/3205 ,  H04N2201/3207 ,  H04N2201/3209 ,  H04N2201/3214 ,  H04N2201/3215 ,  H04N2201/3252 ,  H04N2201/3257 ,  H04N2201/3274 ,  H04N2201/3281

Abstract: The present invention is related to providing, in association with an image, information related to the image capture device used to capture the image. In one embodiment, information related to a first static camera characteristic and camera setting information related to a first captured digitized image is embedded in the first captured digitized image using a watermark. The watermarked information may be used to identify the source or owner of the picture, and/or to aid in the more accurate reproduction of the image.

Abstract translation: 本发明涉及与图像相关联地提供与用于捕获图像的图像捕获装置有关的信息。 在一个实施例中，使用水印将与第一静态相机特性相关的信息和与第一拍摄数字化图像相关的相机设置信息嵌入在第一拍摄数字化图像中。 水印信息可以用于识别图片的源或所有者，和/或帮助更准确地再现图像。

公开(公告)号：US20120197570A1

公开(公告)日：2012-08-02

申请号：US13015464

申请日：2011-01-27

Applicant: Mehran Ramezani ,  Vahid Ordoubadian

Inventor： Mehran Ramezani ,  Vahid Ordoubadian

IPC: G06F19/00 ,  G01R5/22 ,  G01R19/00

CPC classification number: G01R1/06766 ,  G01R31/31709 ,  G01R35/005

Abstract: At least a method and a system are described for monitoring and measuring one or more parameters in an integrated circuit chip by way of receiving a first voltage, a second voltage, and a control signal. In a representative embodiment, the first voltage is used for powering a probe and the second voltage is used as a voltage reference for voltage measurement within the integrated circuit chip. In one or more representative embodiments, the one or more parameters measured comprise minimum and maximum voltage levels of a signal, sampled voltage levels of a signal, a period of a signal, a duty cycle of a clock signal, a jitter of a clock signal, and/or a temperature at a location within the integrated circuit chip.

Abstract translation: 描述了至少一种方法和系统，用于通过接收第一电压，第二电压和控制信号来监视和测量集成电路芯片中的一个或多个参数。 在代表性的实施例中，第一电压用于为探针供电，并且第二电压用作集成电路芯片内的电压测量的电压基准。 在一个或多个代表性实施例中，测量的一个或多个参数包括信号的最小和最大电压电平，信号的采样电压电平，信号的周期，时钟信号的占空比，时钟信号的抖动 ，和/或集成电路芯片内的位置处的温度。