Microscope sample preparation device

    公开(公告)号:US10788404B2

    公开(公告)日:2020-09-29

    申请号:US15935762

    申请日:2018-03-26

    IPC分类号: G01N1/30 G01N1/31 H01J37/20

    摘要: A sample preparation device for electron microscopy (EM) that is configured to eliminate user-to-user variations and environment contaminations, which are often present in the conventional method of sample preparation. The device not only provides a means for evenly and reproducibly delivering a fluid or sample to an EM grid, but also provides a means for sealing the EM grid in an air-tight chamber and delivering air-sensitive samples to the EM grid. The platform may comprise readily fabricated glass chips with features integrated to preserve the integrity of the sample grid and to facilitate its extraction. The methods may eliminate the element of user dependent variability and thus improve the throughput, reproducibility and translation of these methods.

    Microscope sample preparation device

    公开(公告)号:US09958362B1

    公开(公告)日:2018-05-01

    申请号:US15263949

    申请日:2016-09-13

    IPC分类号: G01N1/30 G01N1/31 H01J37/20

    摘要: A sample preparation device for electron microscopy (EM) that is configured to eliminate user-to-user variations and environment contaminations, which are often present in the conventional method of sample preparation. The device not only provides a means for evenly and reproducibly delivering a fluid or sample to an EM grid, but also provides a means for sealing the EM grid in an air-tight chamber and delivering air-sensitive samples to the EM grid. The platform may comprise readily fabricated glass chips with features integrated to preserve the integrity of the sample grid and to facilitate its extraction. The methods may eliminate the element of user dependent variability and thus improve the throughput, reproducibility and translation of these methods.

    MICROSCOPE SAMPLE PREPARATION DEVICE
    3.
    发明申请

    公开(公告)号:US20180209880A1

    公开(公告)日:2018-07-26

    申请号:US15935762

    申请日:2018-03-26

    IPC分类号: G01N1/31 H01J37/20 G01N1/30

    摘要: A sample preparation device for electron microscopy (EM) that is configured to eliminate user-to-user variations and environment contaminations, which are often present in the conventional method of sample preparation. The device not only provides a means for evenly and reproducibly delivering a fluid or sample to an EM grid, but also provides a means for sealing the EM grid in an air-tight chamber and delivering air-sensitive samples to the EM grid. The platform may comprise readily fabricated glass chips with features integrated to preserve the integrity of the sample grid and to facilitate its extraction. The methods may eliminate the element of user dependent variability and thus improve the throughput, reproducibility and translation of these methods.