-
1.
公开(公告)号:US20190041323A1
公开(公告)日:2019-02-07
申请号:US15670550
申请日:2017-08-07
Applicant: The Boeing Company
Inventor: Mark D. Rogers , Loyal Bruce Shawgo , Jeffery Thomas Murphy
IPC: G01N21/359 , G01N21/3563 , G01N21/47 , G01N21/85 , G01J3/50 , G01J3/51
CPC classification number: G01N21/359 , G01J3/0232 , G01J3/0254 , G01J3/08 , G01J3/28 , G01J3/42 , G01J3/506 , G01J3/513 , G01N21/3563 , G01N21/474 , G01N21/85
Abstract: Systems and methods are provided for measuring spectral hemispherical reflectance. One embodiment is a system that includes a laser that emits a beam of light, and an optical chopper disposed between the laser and a sample. The chopper blocks the beam while the chopper is at a first angle of rotation, redirects the beam along a reference path while the chopper is at a second angle of rotation, and permits the beam to follow a sample path through the chopper and strike the sample while the chopper is at a third angle of rotation. The system also includes a hollow sphere that defines a slot through which the sample path and reference path enter the sphere. The hollow sphere includes a spectral hemispherical reflectance detector, a mount that receives the sample at the sphere, and an actuator that rotates the sphere about an axis that intersects the sample.
-
公开(公告)号:US10371628B2
公开(公告)日:2019-08-06
申请号:US15670550
申请日:2017-08-07
Applicant: The Boeing Company
Inventor: Mark D. Rogers , Loyal Bruce Shawgo , Jeffery Thomas Murphy
IPC: G01J3/50 , G01J3/51 , G01N21/47 , G01N21/85 , G01N21/359 , G01N21/3563
Abstract: Systems and methods are provided for measuring spectral hemispherical reflectance. One embodiment is a system that includes a laser that emits a beam of light, and an optical chopper disposed between the laser and a sample. The chopper blocks the beam while the chopper is at a first angle of rotation, redirects the beam along a reference path while the chopper is at a second angle of rotation, and permits the beam to follow a sample path through the chopper and strike the sample while the chopper is at a third angle of rotation. The system also includes a hollow sphere that defines a slot through which the sample path and reference path enter the sphere. The hollow sphere includes a spectral hemispherical reflectance detector, a mount that receives the sample at the sphere, and an actuator that rotates the sphere about an axis that intersects the sample.
-