公开(公告)号：US10101382B2

公开(公告)日：2018-10-16

申请号：US15395907

申请日：2016-12-30

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Alex Paikin ,  Colin Johnson ,  Tathagata Chatterjee ,  Sameer Pendharkar

IPC: G01R31/10 ,  G01R31/26 ,  G01R31/28

Abstract: In at least some embodiments, a system comprises a socket gate terminal configured to receive a first voltage to activate and inactivate a device under test (DUT) coupled to the socket gate terminal. The system also comprises a socket source terminal configured to provide a reference voltage to the DUT. The system further comprises a socket drain terminal configured to provide a second voltage to the DUT to stress the DUT when the DUT is inactive. The socket drain terminal is further configured to receive a third voltage to cause a current to flow through a pathway in the DUT between the socket drain terminal and the socket source terminal when the DUT is active. The socket drain terminal is further configured to provide a fourth voltage indicative of a resistance of the pathway in the DUT when the DUT is active and is heated to a temperature above an ambient temperature associated with the system.

公开(公告)号：US10571511B2

公开(公告)日：2020-02-25

申请号：US16130035

申请日：2018-09-13

Applicant: Texas Instruments Incorporated

Inventor： Alex Paikin ,  Colin Johnson ,  Tathagata Chatterjee ,  Sameer Pendharkar

IPC: G01R31/10 ,  G01R31/26 ,  G01R31/28

Abstract: In at least some embodiments, a system comprises a socket gate terminal configured to receive a first voltage to activate and inactivate a device under test (DUT) coupled to the socket gate terminal. The system also comprises a socket source terminal configured to provide a reference voltage to the DUT. The system further comprises a socket drain terminal configured to provide a second voltage to the DUT to stress the DUT when the DUT is inactive. The socket drain terminal is further configured to receive a third voltage to cause a current to flow through a pathway in the DUT between the socket drain terminal and the socket source terminal when the DUT is active. The socket drain terminal is further configured to provide a fourth voltage indicative of a resistance of the pathway in the DUT when the DUT is active and is heated to a temperature above an ambient temperature associated with the system.