STRUCTURES FOR TESTING NANOSCALE DEVICES INCLUDING FERROELECTRIC CAPACITORS AND METHODS FOR FORMING THE SAME

    公开(公告)号:US20210327888A1

    公开(公告)日:2021-10-21

    申请号:US16852662

    申请日:2020-04-20

    摘要: A ferroelectric device structure includes an array of ferroelectric capacitors overlying a substrate, first metal interconnect structures electrically connecting each of first electrodes of the array of ferroelectric capacitors to a first metal pad embedded in a dielectric material layer, and second metal interconnect structures electrically connecting each of the second electrodes of the array of ferroelectric capacitors to a second metal pad embedded in the dielectric material layer. The second metal pad may be vertically spaced from the substrate by a same vertical separation distance as the first metal pad is from the substrate. First metal lines laterally extending along a first horizontal direction may electrically connect the first electrodes to the first metal pad, and second metal lines laterally extending along the first horizontal direction may electrically connect each of the second electrodes to the second metal pad.