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公开(公告)号:US20230345736A1
公开(公告)日:2023-10-26
申请号:US18341793
申请日:2023-06-27
发明人: Chenchen Jacob Wang , Bo-Feng Young , Yu-Ming Lin , Chi On Chui , Sai-Hooi Yeong
IPC分类号: H10B53/30 , H01L27/07 , H01L27/06 , H01L23/522
CPC分类号: H10B53/30 , H01L27/0733 , H01L28/60 , H01L27/0629 , H01L23/5223 , H01L21/56
摘要: A ferroelectric device structure includes an array of ferroelectric capacitors overlying a substrate, first metal interconnect structures electrically connecting each of first electrodes of the array of ferroelectric capacitors to a first metal pad embedded in a dielectric material layer, and second metal interconnect structures electrically connecting each of the second electrodes of the array of ferroelectric capacitors to a second metal pad embedded in the dielectric material layer. The second metal pad may be vertically spaced from the substrate by a same vertical separation distance as the first metal pad is from the substrate. First metal lines laterally extending along a first horizontal direction may electrically connect the first electrodes to the first metal pad, and second metal lines laterally extending along the first horizontal direction may electrically connect each of the second electrodes to the second metal pad.
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公开(公告)号:US11183504B2
公开(公告)日:2021-11-23
申请号:US16852662
申请日:2020-04-20
发明人: Chenchen Jacob Wang , Yu-Ming Lin , Chi On Chui , Sai-Hooi Yeong , Bo-Feng Young
IPC分类号: H01L27/11507 , H01L27/07 , H01L27/06 , H01L23/522 , H01L49/02 , H01L21/56
摘要: A ferroelectric device structure includes an array of ferroelectric capacitors overlying a substrate, first metal interconnect structures electrically connecting each of first electrodes of the array of ferroelectric capacitors to a first metal pad embedded in a dielectric material layer, and second metal interconnect structures electrically connecting each of the second electrodes of the array of ferroelectric capacitors to a second metal pad embedded in the dielectric material layer. The second metal pad may be vertically spaced from the substrate by a same vertical separation distance as the first metal pad is from the substrate. First metal lines laterally extending along a first horizontal direction may electrically connect the first electrodes to the first metal pad, and second metal lines laterally extending along the first horizontal direction may electrically connect each of the second electrodes to the second metal pad.
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公开(公告)号:US20220028875A1
公开(公告)日:2022-01-27
申请号:US17496857
申请日:2021-10-08
发明人: Chenchen Jacob Wang , Yu-Ming Lin , Chi On Chui , Sai-Hooi Yeong , Bo-Feng Young
IPC分类号: H01L27/11507 , H01L49/02 , H01L27/06 , H01L27/07 , H01L23/522
摘要: A ferroelectric device structure includes an array of ferroelectric capacitors overlying a substrate, first metal interconnect structures electrically connecting each of first electrodes of the array of ferroelectric capacitors to a first metal pad embedded in a dielectric material layer, and second metal interconnect structures electrically connecting each of the second electrodes of the array of ferroelectric capacitors to a second metal pad embedded in the dielectric material layer. The second metal pad may be vertically spaced from the substrate by a same vertical separation distance as the first metal pad is from the substrate. First metal lines laterally extending along a first horizontal direction may electrically connect the first electrodes to the first metal pad, and second metal lines laterally extending along the first horizontal direction may electrically connect each of the second electrodes to the second metal pad.
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公开(公告)号:US11729994B2
公开(公告)日:2023-08-15
申请号:US17496857
申请日:2021-10-08
发明人: Chenchen Jacob Wang , Yu-Ming Lin , Chi On Chui , Sai-Hooi Yeong , Bo-Feng Young
CPC分类号: H10B53/30 , H01L23/5223 , H01L27/0629 , H01L27/0733 , H01L28/60 , H01L21/56
摘要: A ferroelectric device structure includes an array of ferroelectric capacitors overlying a substrate, first metal interconnect structures electrically connecting each of first electrodes of the array of ferroelectric capacitors to a first metal pad embedded in a dielectric material layer, and second metal interconnect structures electrically connecting each of the second electrodes of the array of ferroelectric capacitors to a second metal pad embedded in the dielectric material layer. The second metal pad may be vertically spaced from the substrate by a same vertical separation distance as the first metal pad is from the substrate. First metal lines laterally extending along a first horizontal direction may electrically connect the first electrodes to the first metal pad, and second metal lines laterally extending along the first horizontal direction may electrically connect each of the second electrodes to the second metal pad.
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公开(公告)号:US20210327888A1
公开(公告)日:2021-10-21
申请号:US16852662
申请日:2020-04-20
发明人: Chenchen Jacob WANG , Yu-Ming Lin , Chi On Chui , Sai-Hooi Yeong , Bo-Feng Young
IPC分类号: H01L27/11507 , H01L49/02 , H01L27/07
摘要: A ferroelectric device structure includes an array of ferroelectric capacitors overlying a substrate, first metal interconnect structures electrically connecting each of first electrodes of the array of ferroelectric capacitors to a first metal pad embedded in a dielectric material layer, and second metal interconnect structures electrically connecting each of the second electrodes of the array of ferroelectric capacitors to a second metal pad embedded in the dielectric material layer. The second metal pad may be vertically spaced from the substrate by a same vertical separation distance as the first metal pad is from the substrate. First metal lines laterally extending along a first horizontal direction may electrically connect the first electrodes to the first metal pad, and second metal lines laterally extending along the first horizontal direction may electrically connect each of the second electrodes to the second metal pad.
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