LIGHT SOURCE FOR LITHOGRAPHY EXPOSURE PROCESS

    公开(公告)号:US20190137882A1

    公开(公告)日:2019-05-09

    申请号:US16002180

    申请日:2018-06-07

    IPC分类号: G03F7/20

    摘要: A method for generating a radiation light in a lithography exposure system. The method includes producing a predetermined gas pressure in a storage chamber to supply a first load of a target fuel in the storage chamber via a nozzle. The method further includes irradiating the target fuel from the nozzle with a laser to generate the radiation light. The method also includes increasing the gas pressure in a buffer chamber which receives a second load of target fuel to the predetermined gas pressure. In addition, the method includes actuating the flow of the target fuel from the buffer chamber to the storage chamber.