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    Enhanced material detection by stereo beam profile analysis
    2.
    发明授权
    Enhanced material detection by stereo beam profile analysis 有权

    公开(公告)号：US11906421B2

    公开(公告)日：2024-02-20

    申请号：US18363488

    申请日：2023-08-24

    申请人： TRINAMIX GMBH

    发明人： Patrick Schindler ,  Ruben Huehnerbein ,  Christian Lennartz ,  Jakob Unger

    IPC分类号： G01N21/01 ,  H04N13/254 ,  H04N13/239 ,  G06V10/764 ,  G06V10/145 ,  G06V10/60 ,  G06V10/75 ,  G06V10/147 ,  H04N13/00 ,  G01N21/17

    CPC分类号： G01N21/01 ,  G06V10/145 ,  G06V10/147 ,  G06V10/60 ,  G06V10/751 ,  G06V10/759 ,  G06V10/764 ,  H04N13/239 ,  H04N13/254 ,  G01N2021/0106 ,  G01N2021/177 ,  H04N2013/0074

    摘要： A detector (110) for determining at least one material property of at least one object (112) is proposed. The detector (110) comprises



    at least one projector (116) configured for illuminating the object (112) with at least one illumination pattern (118) comprising a plurality of illumination features (120);
    at least one first camera (122) having at least one first sensor element, wherein the first sensor element has a matrix of first optical sensors, the first optical sensors each having a light-sensitive area, wherein each first optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object (112) to the first camera (122), wherein the first camera (122) is configured for imaging at least one first reflection image comprising a plurality of first reflection features generated by the object (112) in response to illumination by the illumination features (120), wherein the first camera (122) is arranged such that the first reflection image is imaged under a first direction of view to the object (112);
    at least one second camera (124) having at least one second sensor element, wherein the second sensor element has a matrix of second optical sensors, the second optical sensors each having a light-sensitive area, wherein each second optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object (112) to the second camera (124), wherein the second camera (124) is configured for imaging at least one second reflection image comprising a plurality of second reflection features generated by the object (112) in response to illumination by the illumination feature (120), wherein the second camera (124) is arranged such that the second reflection image is imaged under a second direction of view to the object (112), wherein the first direction of view and the second direction of view differ;
    at least one evaluation device (126) configured for evaluating the first reflection image and the second reflection image, wherein the evaluation comprises matching the first reflection features and the second reflection features and determining a combined material property of matched pairs of first and second reflection features by analysis of their beam profiles.