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公开(公告)号:US11803548B1
公开(公告)日:2023-10-31
申请号:US17578278
申请日:2022-01-18
Applicant: SPLUNK INC.
Inventor: Kieran Nicholas Cairney , Jindrich Dinga , Murugan Kandaswamy , Vishal Patel
IPC: G06F7/00 , G06F16/2455 , G06F16/23
CPC classification number: G06F16/24553 , G06F16/2379
Abstract: A log-to-metrics transformation system includes a log-to-metrics application executing on a processor. The log-to-metrics transformation system receives a format associated with machine data, and further receives, via a first graphical control, a first set of metric identifiers corresponding to a first set of metrics associated with the machine data. The log-to-metrics transformation system generates a first set of mappings between the first set of metric identifiers and a first set of field values included in the machine data. The log-to-metrics transformation system stores the first set of mappings and an association with the format of the machine data. The log-to-metrics transformation system, based on the first set of mappings, causes the first set of field values to be extracted from the machine data. Further, a first metric included in the first set of metrics is determined based on at least a portion of the first set of field values.
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公开(公告)号:US11226964B1
公开(公告)日:2022-01-18
申请号:US16147438
申请日:2018-09-28
Applicant: Splunk Inc.
Inventor: Kieran Nicholas Cairney , Jindrich Dinga , Murugan Kandaswamy , Vishal Patel
IPC: G06F7/00 , G06F16/2455 , G06F16/23
Abstract: A log-to-metrics transformation system includes a log-to-metrics application executing on a processor. The log-to-metrics transformation system receives a format associated with machine data, and further receives, via a first graphical control, a first set of metric identifiers corresponding to a first set of metrics associated with the machine data. The log-to-metrics transformation system generates a first set of mappings between the first set of metric identifiers and a first set of field values included in the machine data. The log-to-metrics transformation system stores the first set of mappings and an association with the format of the machine data. The log-to-metrics transformation system, based on the first set of mappings, causes the first set of field values to be extracted from the machine data. Further, a first metric included in the first set of metrics is determined based on at least a portion of the first set of field values.
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