Invention Grant
- Patent Title: Automated generation of metrics from log data
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Application No.: US16147438Application Date: 2018-09-28
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Publication No.: US11226964B1Publication Date: 2022-01-18
- Inventor: Kieran Nicholas Cairney , Jindrich Dinga , Murugan Kandaswamy , Vishal Patel
- Applicant: Splunk Inc.
- Applicant Address: US CA San Francisco
- Assignee: Splunk Inc.
- Current Assignee: Splunk Inc.
- Current Assignee Address: US CA San Francisco
- Agency: Artegis Law Group, LLP
- Main IPC: G06F7/00
- IPC: G06F7/00 ; G06F16/2455 ; G06F16/23

Abstract:
A log-to-metrics transformation system includes a log-to-metrics application executing on a processor. The log-to-metrics transformation system receives a format associated with machine data, and further receives, via a first graphical control, a first set of metric identifiers corresponding to a first set of metrics associated with the machine data. The log-to-metrics transformation system generates a first set of mappings between the first set of metric identifiers and a first set of field values included in the machine data. The log-to-metrics transformation system stores the first set of mappings and an association with the format of the machine data. The log-to-metrics transformation system, based on the first set of mappings, causes the first set of field values to be extracted from the machine data. Further, a first metric included in the first set of metrics is determined based on at least a portion of the first set of field values.
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