-
公开(公告)号：US11631184B2
公开(公告)日：2023-04-18
申请号：US17024792
申请日：2020-09-18
发明人： Mark Davis Haynes , Glen Paul Cork , Bharath Achyutha Rao , John Thomas Baumfalk-Lee , Matthew W. McKenna , Bruce E. Gabel , Scott Bishop , Gregorio Balandran
摘要： A system for inspecting features of an airframe, the system including a feature inspection device configured to measure an aspect of a first feature and a tracking subsystem configured to determine a position of the feature inspection device when the feature inspection device measures the aspect of the first feature. The system is configured to determine a position of the first feature on the airframe via the feature inspection device and the tracking subsystem, the determination of the position of the first feature being independent from the measurement of the aspect of the first feature.
-
公开(公告)号：US20230252648A1
公开(公告)日：2023-08-10
申请号：US18136124
申请日：2023-04-18
发明人： Mark Davis Haynes , Glen Paul Cork , Bharath Achyutha Rao , John Thomas Baumfalk-Lee , Matthew W. McKenna , Bruce E. Gabel , Scott Bishop , Gregorio Balandran
CPC分类号： G06T7/246 , G01N21/88 , G06T2207/10032 , B64F5/40
摘要： A system for inspecting features of an airframe, the system including a feature inspection device configured to measure an aspect of a first feature and a tracking subsystem configured to determine a position of the feature inspection device when the feature inspection device measures the aspect of the first feature. The system is configured to determine a position of the first feature on the airframe via the feature inspection device and the tracking subsystem, the determination of the position of the first feature being independent from the measurement of the aspect of the first feature.
-
公开(公告)号：US20220092793A1
公开(公告)日：2022-03-24
申请号：US17024792
申请日：2020-09-18
发明人： Mark Davis Haynes , Glen Paul Cork , Bharath Achyutha Rao , John Thomas Baumfalk-Lee , Matthew W. McKenna , Bruce E. Gabel , Scott Bishop , Gregorio Balandran
摘要： A system for inspecting features of an airframe, the system including a feature inspection device configured to measure an aspect of a first feature and a tracking subsystem configured to determine a position of the feature inspection device when the feature inspection device measures the aspect of the first feature. The system is configured to determine a position of the first feature on the airframe via the feature inspection device and the tracking subsystem, the determination of the position of the first feature being independent from the measurement of the aspect of the first feature.
-
公开(公告)号：US20220092766A1
公开(公告)日：2022-03-24
申请号：US17465967
申请日：2021-09-03
发明人： Mark Davis Haynes , Glen Paul Cork , Bharath Achyutha Rao , John Thomas Baumfalk-Lee , Matthew W. McKenna , Bruce E. Gabel , Scott Bishop , Gregorio Balandran
摘要： A system for inspecting features of an airframe, the system including a feature inspection device configured to measure an aspect of a first feature and a tracking subsystem configured to determine a position of the feature inspection device when the feature inspection device measures the aspect of the first feature. The system is configured to determine a position of the first feature on the airframe via the feature inspection device and the tracking subsystem, the determination of the position of the first feature being independent from the measurement of the aspect of the first feature.
-
-
-
搜索结果
4 条记录 (耗时 0.013 秒)
