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公开(公告)号：US12061116B2
公开(公告)日：2024-08-13
申请号：US17876250
申请日：2022-07-28
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Mohamed H. Al Haron , Bassem Mortada , Ahmed Othman , Diaa Khalil , Bassam Saadany , Ahmed Shebl , Botros George Iskander Shenouda
CPC classification number: G01J3/0256 , G01J3/0208 , G01J3/0216 , G01J3/0286 , G01J3/108 , G01J3/45 , G01J3/4532 , G01N33/4833 , G01J2003/283 , G01J2003/2873 , G01J2003/4534
Abstract: Aspects relate to a spectral analyzer that can be used for biological sample detection. The spectral analyzer includes an optical window configured to receive a sample and a spectral sensor including a chassis having various component assembled thereon. Examples of components may include a light source, a light modulator, illumination and collection optical elements, a detector, and a processor. The spectral analyzer is configured to obtain spectral data representative of a spectrum of the sample using, for example, an artificial intelligence (AI) engine. The spectral analyzer further includes a thermal separator positioned between the light modulator and the light source.
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公开(公告)号：US20170012199A1
公开(公告)日：2017-01-12
申请号：US15203773
申请日：2016-07-06
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Diaa Khalil , Tarik E. Bourouina , Momen Anwar
IPC: H01L49/00
CPC classification number: H01L49/00 , G01J3/0205 , G01J3/0208 , G01J3/0216 , G01J3/0237 , G01J3/0245 , G01J3/108 , G01J3/26 , G01J3/42 , H01K1/04 , H01K1/14
Abstract: An optical radiation source produced from a disordered semiconductor material, such as black silicon, is provided. The optical radiation source includes a semiconductor substrate, a disordered semiconductor structure etched in the semiconductor substrate and a heating element disposed proximal to the disordered semiconductor structure and configured to heat the disordered semiconductor structure to a temperature at which the disordered semiconductor structure emits thermal infrared radiation.
Abstract translation: 提供由诸如黑色硅的无序半导体材料产生的光辐射源。 光辐射源包括半导体衬底，在半导体衬底中蚀刻的无序半导体结构和设置在无序半导体结构附近的加热元件，其被配置为将无序半导体结构加热到无序半导体结构发射热红外辐射的温度 。
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公开(公告)号：US20230036551A1
公开(公告)日：2023-02-02
申请号：US17876250
申请日：2022-07-28
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Mohamed H. Al Haron , Bassem Mortada , Ahmed Othman , Diaa Khalil , Bassam Saadany , Ahmed Shebl , Botros George Iskander Shenouda
IPC: G01J3/02 , G01J3/45 , G01J3/10 , G01N33/483
Abstract: Aspects relate to a spectral analyzer that can be used for biological sample detection. The spectral analyzer includes an optical window configured to receive a sample and a spectral sensor including a chassis having various component assembled thereon. Examples of components may include a light source, a light modulator, illumination and collection optical elements, a detector, and a processor. The spectral analyzer is configured to obtain spectral data representative of a spectrum of the sample using, for example, an artificial intelligence (AI) engine. The spectral analyzer further includes a thermal separator positioned between the light modulator and the light source.
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4.发明公开公开(公告)号：US20230393173A1
公开(公告)日：2023-12-07
申请号：US18204853
申请日：2023-06-01
Applicant: Si-Ware Systems
Inventor： Tarek Mohamed Zeinah , Bassem Mortada , Momen Anwar , Mohamed Ramadan , Mohamed Hamouda , Yasser M. Sabry , Diaa Khalil , Ahmed Shebl , Bassam Saadany , Ahmed Emad , Mohamed Badr , Moez ElMassry
CPC classification number: G01R1/07342 , G06T7/0004 , G06T7/73 , G06T2207/30148 , G08B21/182
Abstract: Aspects of the disclosure relate to an apparatus including an opto-electrical probe card platform for wafer-level testing of optical micro-electro-mechanical-systems (MEMS) structures. The probe card platform includes an electrical probe card including alignment needles for aligning with an optical MEMS structure during testing thereof. The probe card platform further includes an optical head configured to direct input light to towards the optical MEMS structure through the electrical probe card and an optical positioner attached to the electrical probe card and configured to align the optical head. The apparatus may further include a camera and a processor configured to process at least one image obtained by the camera and to generate alignment assistance data to assist the optical positioner in aligning the optical head.
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公开(公告)号：US09793478B2
公开(公告)日：2017-10-17
申请号：US15203773
申请日：2016-07-06
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Diaa Khalil , Tarik E. Bourouina , Momen Anwar
CPC classification number: H01L49/00 , G01J3/0205 , G01J3/0208 , G01J3/0216 , G01J3/0237 , G01J3/0245 , G01J3/108 , G01J3/26 , G01J3/42 , H01K1/04 , H01K1/14
Abstract: An optical radiation source produced from a disordered semiconductor material, such as black silicon, is provided. The optical radiation source includes a semiconductor substrate, a disordered semiconductor structure etched in the semiconductor substrate and a heating element disposed proximal to the disordered semiconductor structure and configured to heat the disordered semiconductor structure to a temperature at which the disordered semiconductor structure emits thermal infrared radiation.
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Patent Agency Ranking
公开(公告)号：US11841268B2
公开(公告)日：2023-12-12
申请号：US17590781
申请日：2022-02-01
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Bassem A. Mortada , Khaled Hassan , Abdelrahman Ahmed Maher Mohamed Elsayed Salem , Diaa Khalil , Mohamed H. Al Haron , Mohammed Ahmed Elsheikh , Ahmed Shebl , Bassam Saadany , Mostafa Medhat , Botros George Iskander Shenouda
CPC classification number: G01J3/0256 , G01J3/0216 , G02B19/0019
Abstract: Aspects relate to a compact material analyzer including a light source, a detector, and a module including a first optical window on a first side of the module, a second optical window on a second side of the module opposite the first side, and a light modulator. The light source produces input light at a high power that is passed through the first optical window to the light modulator. The light modulator is configured to attenuate the input light, produce modulated light based on the input light, and direct the modulated light through the second optical window to the sample. The modulated light produced by the light modulator is at a lower power safe for the sample. The detector is configured to receive output light from the sample produced from interaction with the modulated light through the second optical window and to detect a spectrum of the output light.
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公开(公告)号：US20220404361A1
公开(公告)日：2022-12-22
申请号：US17841559
申请日：2022-06-15
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Momen Anwar , Amr O. Ghoname , Mohamed H. Al Haron , Moustafa Mohamed , Mohamed Kilany , Mazen Erfan , Bassam Saadany , Diaa Khalil , Bassem Mortada , Erik R. Deutsch
IPC: G01N33/569 , G01N21/552 , G01N21/359
Abstract: Aspects relate to a spectroscopic analyzer device that can be used for biological sample detection, and specifically for virus infection detection. The spectroscopic analyzer device includes a spectrometer, such as a micro-electro-mechanical systems (MEMS) based infrared spectrometer, and an artificial intelligence (AI) for screening of viral samples. In addition, the spectroscopic analyzer device includes a light source and a disposable optical component configured to receive a sample and to facilitate light interaction with the sample.
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公开(公告)号：US20220244101A1
公开(公告)日：2022-08-04
申请号：US17590781
申请日：2022-02-01
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Bassem A. Mortada , Khaled Hassan , Abdelrahman Ahmed Maher Mohamed Elsayed Salem , Diaa Khalil , Mohamed H. Al Haron , Mohammed Ahmed Elsheikh , Ahmed Shebl , Bassam Saadany , Mostafa Medhat , Botros George Iskander Shenouda
Abstract: Aspects relate to a compact material analyzer including a light source, a detector, and a module including a first optical window on a first side of the module, a second optical window on a second side of the module opposite the first side, and a light modulator. The light source produces input light at a high power that is passed through the first optical window to the light modulator. The light modulator is configured to attenuate the input light, produce modulated light based on the input light, and direct the modulated light through the second optical window to the sample. The modulated light produced by the light modulator is at a lower power safe for the sample. The detector is configured to receive output light from the sample produced from interaction with the modulated light through the second optical window and to detect a spectrum of the output light.
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公开(公告)号：US20160282184A1
公开(公告)日：2016-09-29
申请号：US15009755
申请日：2016-01-28
Applicant: Si-Ware Systems
Inventor： Diaa Khalil , Bassam A. Saadany , Yasser M. Sabry
CPC classification number: G01J3/45 , G01J3/0256 , G01J3/108 , G01J3/26 , G01J3/453 , G01J3/4531 , G01J3/4532 , G01J3/4535
Abstract: A spectrometer with increased optical throughput and/or spectral resolution includes a plurality of interferometers coupled in parallel. An optical splitter divides a source light beam into a plurality of input beams and directs each of the input beams to a respective one of the plurality of interferometers. One or more detectors are optically coupled to receive a respective output from each of the plurality of interferometers and is configured to detect an interferogram produced as a result of the outputs.
Abstract translation: 具有增加的光学吞吐量和/或光谱分辨率的光谱仪包括并联耦合的多个干涉仪。 光分路器将源光束分成多个输入光束，并将每个输入光束引导到多个干涉仪中的相应一个。 一个或多个检测器被光学耦合以从多个干涉仪中的每一个接收相应的输出，并且被配置为检测作为输出结果产生的干涉图。
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公开(公告)号：US11953377B2
公开(公告)日：2024-04-09
申请号：US17671983
申请日：2022-02-15
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Amr O. Ghoname , Momen Anwar , Diaa Khalil
CPC classification number: G01J3/45 , G01J3/021 , G01J3/26 , G01N21/35 , G01N21/552 , G02B6/26 , G02B26/0833 , G02F1/29 , G01N2021/3595 , G02F2201/124
Abstract: Aspects relate to an integrated and compact attenuated total internal reflection (ATR) spectral sensing device. The spectral sensing device includes a substrate, a spectrometer, and a detector. The substrate includes an ATR element, a microfluidic channel, and a channel interface at a boundary between the ATR element and the microfluidic channel formed therein. The ATR element is configured to receive input light and to direct the input light to the channel interface for total internal reflection of the input light at the channel interface. An evanescent wave produced by a sample contained within the microfluidic channel based on the total internal reflection of the input light attenuates the light output from the ATR element and the resulting output light may be analyzed using the spectrometer and the detector.
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