METHOD OF FABRICATING A SELF-ALIGNING DAMASCENE MEMORY STRUCTURE
    1.
    发明申请
    METHOD OF FABRICATING A SELF-ALIGNING DAMASCENE MEMORY STRUCTURE 有权
    自制符号大气记忆结构的制作方法

    公开(公告)号:US20130175675A1

    公开(公告)日:2013-07-11

    申请号:US13781983

    申请日:2013-03-01

    Applicant: SanDisk 3D LLC

    Abstract: A method of forming a memory cell is provided. The method includes forming a first pillar-shaped element that includes a first semiconductor material, forming a first opening self-aligned with the first pillar-shaped element, and depositing a second semiconductor material in the first opening to form a second pillar-shaped element above the first pillar-shaped element. Other aspects are also provided.

    Abstract translation: 提供一种形成存储单元的方法。 该方法包括:形成包括第一半导体材料的第一柱状元件,形成与第一柱状元件自对准的第一开口,以及在第一开口中沉积第二半导体材料以形成第二柱状元件 在第一个柱状元件之上。 还提供其他方面。

    Method of fabricating a self-aligning damascene memory structure
    2.
    发明授权
    Method of fabricating a self-aligning damascene memory structure 有权
    制造自对准大马士革记忆结构的方法

    公开(公告)号:US08633105B2

    公开(公告)日:2014-01-21

    申请号:US13781983

    申请日:2013-03-01

    Applicant: SanDisk 3D LLC

    Abstract: A method of forming a memory cell is provided. The method includes forming a first pillar-shaped element that includes a first semiconductor material, forming a first opening self-aligned with the first pillar-shaped element, and depositing a second semiconductor material in the first opening to form a second pillar-shaped element above the first pillar-shaped element. Other aspects are also provided.

    Abstract translation: 提供一种形成存储单元的方法。 该方法包括:形成包括第一半导体材料的第一柱状元件,形成与第一柱状元件自对准的第一开口,以及在第一开口中沉积第二半导体材料以形成第二柱状元件 在第一个柱状元件之上。 还提供其他方面。

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