Stethoscope head and stethoscope comprising same

    公开(公告)号:US10307132B2

    公开(公告)日:2019-06-04

    申请号:US15511124

    申请日:2014-12-18

    Abstract: A stethoscope head, according to an embodiment of the present invention, may include: an auscultatory sound receiver; a support member configured to support the auscultatory sound receiver; and a moving member comprising a light source configured to emit ultraviolet rays for sterilization to the auscultatory sound receiver, and capable of moving a position thereof with respect to the auscultatory sound receiver and the support member in a first direction orienting to an object and a second direction opposite to the first direction.

    Probe apparatus, medical instrument comprising same, and control method of probe apparatus

    公开(公告)号:US11344280B2

    公开(公告)日:2022-05-31

    申请号:US15759327

    申请日:2016-10-14

    Abstract: An example medical probe apparatus includes a main body; and a head which is detachably provided in the main body, and includes a transducer array configured to output an ultrasound for diagnosis of an object, the main body including: a transceiver configured to transmit and receive a signal to and from the transducer array through a plurality of channels; and at least one processor configured to control the transceiver to transmit a predetermined test signal to the transducer array of the head mounted to the main body, determine a probe type corresponding to the transducer array of the mounted head based on a feedback signal received through the transceiver in response to the test signal, and make the probe apparatus operate corresponding to the determined probe type.

    Conductive atomic force microscope and method of operating the same
    8.
    发明授权
    Conductive atomic force microscope and method of operating the same 有权
    导电原子力显微镜及其操作方法

    公开(公告)号:US09261532B1

    公开(公告)日:2016-02-16

    申请号:US14694115

    申请日:2015-04-23

    CPC classification number: G01Q60/40 G01Q70/06

    Abstract: A conductive atomic force microscope including a plurality of probe structures each including a probe and a cantilever connected thereto, a power supplier applying a bias voltage, a current detector detecting a first current flowing between a sample object and each of the probes and a second current flowing between a measurement object and each of the probes, and calculating representative currents for the sample and measurement objects based on the first and second currents, respectively, and a controller calculating a ratio between representative currents of the sample object measured by each of the probe structures, calculating a scaling factor for scaling the representative current with respect to the measurement object measured by each of the probes, and determine a reproducible current measurement value based on the second measurement current and the scaling factor may be provided.

    Abstract translation: 一种导电原子力显微镜,包括多个探针结构,每个探针结构包括探针和连接到其上的悬臂,施加偏置电压的电源,检测在样品物体和每个探针之间流动的第一电流的电流检测器和第二电流 在测量对象和每个探针之间流动,并且基于第一和第二电流分别计算样本和测量对象的代表性电流,以及控制器,计算由每个探针测量的样本对象的代表性电流之间的比率 计算相对于由每个探针测量的测量对象的代表性电流的缩放因子,并且可以提供基于第二测量电流和缩放因子来确定可重现的电流测量值。

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