公开(公告)号：US20230305282A1

公开(公告)日：2023-09-28

申请号：US18175452

申请日：2023-02-27

Applicant: Samsung Electronics Co., Ltd.

Inventor： Ken OZAWA ,  Shinji UEYAMA ,  Tomoki ONISHI

IPC: G02B21/00 ,  G02B21/06 ,  G02B21/36

CPC classification number: G02B21/0092 ,  G02B21/06 ,  G02B21/361

Abstract: The polarized microscope includes a light source configured to generate illumination light, a polarizer configured to interact with the generated illumination light to transmit rectilinear polarized light having a first orientation, an analyzer configured to transmit a component of rectilinear polarized light reflected by a sample, the reflected rectilinear polarized light having a second orientation, an image obtainer configured to obtain an image of the reflected rectilinear polarized light, and an image processor configured to process the obtained image, wherein the image processor is configured to calculate a device integer, obtain a plurality of hysteresis loops for each of regions of interest (ROIs), and calculate a rotation angle of a Kerr rotation of each ROI by using the device integer and the plurality of hysteresis loops.

公开(公告)号：US20230125628A1

公开(公告)日：2023-04-27

申请号：US18047820

申请日：2022-10-19

Applicant: Samsung Electronics Co., Ltd.

Inventor： Shinji UEYAMA ,  Ingi KIM ,  Harutaka SEKIYA ,  Tomoki ONISHI

IPC: G11C11/16 ,  G01R33/12

Abstract: To reduce a measurement time, an inspection device includes a stage configured to fix a magnetoresistive random access memory (MRAM) to a stage surface and moving the MRAM, a plurality of magnets configured to generate a gradient magnetic, a plurality of line sensors comprising a first line sensor for detecting a magneto-optical effect at a first location of the MRAM and a second line sensor for detecting the magneto-optical effect at a second location that is different from the first location by moving a location of the MRAM within the gradient magnetic field, and an information processor configured to process the magneto-optical effect detected by the plurality of line sensors. Thus, throughput may be improved.

公开(公告)号：US20220137160A1

公开(公告)日：2022-05-05

申请号：US17467967

申请日：2021-09-07

Applicant: Samsung Electronics Co., Ltd.

Inventor： Harutaka SEKIYA ,  Shinji UEYAMA ,  Tomoki ONISHI

IPC: G01R33/032 ,  G01R33/00

Abstract: The inventive concepts provide a magnetic property measurement apparatus capable of quickly measuring a magnetic property of a subject without a decrease in a measurement speed that might occur due to an electromagnet. In addition, the inventive concepts provide a magnetic property measurement apparatus capable of monitoring a magnetization distribution of a memory device as an image and integrating images by using a TDI camera, thereby being capable of performing highly sensitive measurement and not having to capture images for a long time. The magnetic property measurement apparatus includes: a magnetic field generation unit configured to generate a magnetic field which is constant with time and varies with relative position; a mobile unit configured to move a subject to be measured in the magnetic field; and a measurement unit configured to measure a magnetic property of the subject moving in the magnetic field.