MILLIMETER WAVE MODULE INSPECTION SYSTEM, MILLIMETER WAVE MODULE INSPECTION DEVICE, AND MILLIMETER WAVE MODULE INSPECTION METHOD

    公开(公告)号:US20240007202A1

    公开(公告)日:2024-01-04

    申请号:US18369601

    申请日:2023-09-18

    CPC classification number: H04B17/19 H04B1/38

    Abstract: A millimeter wave module inspection system includes: an electronic device including at least one processor; and a millimeter wave module including a memory, at least one antenna, and at least one transceiver, wherein the at least one processor is configured to: control an input signal to be input to a transmission signal input terminal of the millimeter wave module; identify an output signal that is output from a reception signal output terminal of the millimeter wave module when the input signal passes through the at least one antenna of the millimeter wave module; identify first data corresponding to a transmission chain gain related to a transmission path of the millimeter wave module stored in the memory and second data corresponding to a reception chain gain related to a reception path of the millimeter wave module, the first data and the second data being stored in the memory; and determine whether the millimeter wave module is abnormal based at least on the identified output signal, the first data, and the second data.

    PROTECTION CIRCUIT IN ELECTRONIC DEVICE AND METHOD THEREFOR

    公开(公告)号:US20220337200A1

    公开(公告)日:2022-10-20

    申请号:US17263044

    申请日:2020-10-30

    Abstract: An electronic device and method thereof of are provided to prevent burnout due to overcurrent. An electronic device includes a power amplifier configured to amplify a transmission signal; a battery configured to provide a bias voltage to the at least one power amplifier; and an overcurrent protection circuit configured to prevent overcurrent from flowing through the power amplifier. The overcurrent protection circuit includes a configurer configured to configure a reference current value, based on the power amplifier; a measurer configured to measure a bias current value due to the bias voltage; a comparator configured to compare the measured bias current value with the reference current value; and a controller configured to recognize overcurrent flowing through the power amplifier and control provision of the bias voltage, based on a result of the comparison.

    PROTECTION CIRCUIT IN ELECTRONIC DEVICE AND METHOD THEREFOR

    公开(公告)号:US20240421777A1

    公开(公告)日:2024-12-19

    申请号:US18815287

    申请日:2024-08-26

    Abstract: An electronic device and method thereof of are provided to prevent burnout due to overcurrent. An electronic device includes a power amplifier configured to amplify a transmission signal; a battery configured to provide a bias voltage to the at least one power amplifier; and an overcurrent protection circuit configured to prevent overcurrent from flowing through the power amplifier. The overcurrent protection circuit includes a configurer configured to configure a reference current value, based on the power amplifier; a measurer configured to measure a bias current value due to the bias voltage; a comparator configured to compare the measured bias current value with the reference current value; and a controller configured to recognize overcurrent flowing through the power amplifier and control provision of the bias voltage, based on a result of the comparison.

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