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公开(公告)号:US20240006435A1
公开(公告)日:2024-01-04
申请号:US18311401
申请日:2023-05-03
Applicant: Samsung Electronics Co., Ltd.
Inventor: Byeong Eun KWAK , Yeon Woo Kim , Sook Young Roh , Junwon Han , Seok Ho Yun , Ki-Ryong Lee
IPC: H01L27/146
CPC classification number: H01L27/1462 , H01L27/14645 , H01L27/14621 , H01L27/1463 , H01L27/14685 , G02B1/11
Abstract: An image sensor with improved performance is provided. The image sensor includes a substrate, a prism structure on the substrate, the prism structure including at least one nanopattern, and an anti-reflection structure on the prism structure, the anti-reflection structure including at least one opening array, the opening array including a plurality of spaced-apart openings.
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公开(公告)号:US10199366B2
公开(公告)日:2019-02-05
申请号:US15627536
申请日:2017-06-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Seungwon Kim , Su-Jin Kwon , Junwon Han , Hyunwoo Kim , Byung Lyul Park
Abstract: A method of manufacturing a semiconductor package, the method including forming a hole that penetrates an interconnect substrate; providing a first carrier substrate below the interconnect substrate; providing a semiconductor chip in the hole; forming a molding layer by coating a molding composition on the semiconductor chip and the interconnect substrate; adhering a second carrier substrate onto the molding layer with an adhesive layer; removing the first carrier substrate to expose a bottom surface of the semiconductor chip and a bottom surface of the interconnect substrate; forming a redistribution substrate below the semiconductor chip and the interconnect substrate; detaching the second carrier substrate from the adhesive layer; and removing the adhesive layer.
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