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公开(公告)号:US20180145080A1
公开(公告)日:2018-05-24
申请号:US15644877
申请日:2017-07-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Dong Wan KIM , Ji Hun KIM , Jae Joon SONG , Hiroshi TAKEDA , Jung Hoon HAN
IPC: H01L27/108 , H01L29/423 , H01L29/49 , H01L29/06 , H01L23/528 , H01L21/28
CPC classification number: H01L27/10823 , H01L21/02164 , H01L21/0217 , H01L21/28088 , H01L21/7682 , H01L23/528 , H01L27/10814 , H01L27/10876 , H01L29/0649 , H01L29/4236 , H01L29/4966 , H01L29/4991 , H01L29/66621
Abstract: A semiconductor device including a substrate; a trench formed within the substrate; a gate insulating film formed conformally along a portion of a surface of the trench; a gate electrode formed on the gate insulating film and filling a portion of the trench; a capping film formed on the gate electrode and filling the trench; and an air gap formed between the capping film and the gate insulating film.
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公开(公告)号:US20180122810A1
公开(公告)日:2018-05-03
申请号:US15621315
申请日:2017-06-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jung Hoon HAN , Dong Wan KIM , Ji Hun KIM , Jae Joon SONG , Hiroshi TAKEDA
IPC: H01L27/108 , H01L49/02
CPC classification number: H01L27/10814 , H01L27/10852 , H01L27/10894 , H01L28/60 , H01L28/90
Abstract: A semiconductor device is provided. The semiconductor device includes an upper interlayer insulating layer disposed on a substrate. A first electrode spaced apart from the upper interlayer insulating layer is disposed on the substrate. A contact structure penetrating the upper interlayer insulating layer is disposed on the substrate. An upper support layer having a first portion covering an upper surface of the upper interlayer insulating layer, to surround an upper side surface of the contact structure, and a second portion extending in a horizontal direction from the first portion and surrounding an upper side surface of the first electrode, is disposed. A dielectric conformally covering the first electrode and a second electrode on the dielectric are disposed.
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