公开(公告)号：US20210294697A1

公开(公告)日：2021-09-23

申请号：US17319844

申请日：2021-05-13

Applicant: Samsung Electronics Co., Ltd.

Inventor： DIMIN NIU ,  Mu-Tien Chang ,  Hongzhong Zheng ,  Hyun-Joong Kim ,  Won-hyung Song ,  Jangseok Choi

IPC: G06F11/10 ,  G11C5/04 ,  G11C29/42 ,  G11C29/52

Abstract: A method of correcting a memory error of a dynamic random-access memory module (DRAM) using a double data rate (DDR) interface, the method includes conducting a memory transaction including multiple bursts with a memory controller to send data from data chips of the DRAM to the memory controller, detecting one or more errors using an ECC chip of the DRAM, determining a number of the bursts having the errors using the ECC chip of the DRAM, determining whether the number of the bursts having the errors is greater than a threshold number, determining a type of the errors, and directing the memory controller based on the determined type of the errors, wherein the DRAM includes a single ECC chip per memory channel.