公开(公告)号：US10217680B2

公开(公告)日：2019-02-26

申请号：US15403330

申请日：2017-01-11

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dae Seo Park ,  Song Ho Jeong ,  Oh Seok Kwon ,  Jong Tae Kim ,  Choo Ho Kim

IPC: G06K9/00 ,  H01L21/66 ,  G01N21/64 ,  G01N21/95 ,  H01L33/56

Abstract: A test apparatus includes a lighting unit radiating light on a to-be-tested object having a light transmitting resin containing a light conversion material; a camera unit obtaining an image of the to-be-tested object while the light transmitting resin is emitted by receiving light emitted by the lighting unit; and a controller determining whether the to-be-tested object is defective by calculating gray values from the image obtained by the camera unit.

公开(公告)号：US09627279B2

公开(公告)日：2017-04-18

申请号：US14502463

申请日：2014-09-30

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Won Soo Ji ,  Choo Ho Kim ,  Sung Hoon Oh ,  Min Hwan Kim ,  Beom Seok Shin

IPC: G01R31/28 ,  H01L21/66 ,  G01R31/26 ,  H01L33/48

CPC classification number: H01L22/14 ,  G01R31/2601 ,  G01R31/2635 ,  H01L33/48 ,  H01L2933/0033 ,  H01L2933/005 ,  Y10T29/51

Abstract: An apparatus for manufacturing an light emitting diode (LED) package, includes: a heating unit heating an LED package array in a lead frame state in which a plurality of LED packages are installed to be set in an array on a lead frame; a testing unit testing an operational state of each of the LED packages in the LED package array by applying a voltage or a current to the LED package array heated by the heating unit; and a cutting unit cutting only an LED package determined to be a functional product or an LED package determined to be a defective product from the lead frame to remove the same according to the testing results of the testing unit.

公开(公告)号：US09347772B2

公开(公告)日：2016-05-24

申请号：US14169324

申请日：2014-01-31

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Dae Seo Park ,  Dae Gwan Kim ,  Won Soo Ji ,  Choo Ho Kim

IPC: G01B11/25

CPC classification number: G01B11/2513 ,  G01B11/254

Abstract: An apparatus for measurement of a three-dimensional (3D) shape includes a lens unit transmitting slit beams to a plurality of measurement objects, a light source unit irradiating the plurality of slit beams to the lens unit at different angles, an imaging unit obtaining images of the plurality of measurement objects formed by the slit beams irradiated on the plurality of measurement objects, and a calculation processing unit generating information regarding a 3D shape of the plurality of measurement objects from the images obtained by the imaging unit.

Abstract translation: 一种用于测量三维（3D）形状的装置包括：透镜单元，其向多个测量对象发射狭缝光束;光源单元，以不同的角度将多个狭缝光束照射到所述透镜单元;成像单元，获得图像 所述多个测量对象由照射在所述多个测量对象上的所述狭缝光束形成;以及计算处理单元，从由所述成像单元获得的图像生成关于所述多个测量对象的3D形状的信息。