TERAHERTZ PROBE
    1.
    发明公开
    TERAHERTZ PROBE 审中-公开

    公开(公告)号:US20230417820A1

    公开(公告)日:2023-12-28

    申请号:US18134731

    申请日:2023-04-14

    CPC classification number: G01R31/2656 G01R1/07

    Abstract: According to embodiments, a cantilever is provided. The cantilever includes a first conductive line, a second conductive line, and a third conductive line extending on the substrate, a microtip arranged on the substrate, and an emitter antenna arranged on the microtip, connected to the first to third conductive lines, and configured to produce a scattering signal of a terahertz wave band, wherein the emitter antenna includes a first emitter electrode connected to the first conductive line, a second emitter electrode connected to the second conductive line and adjacent to the first emitter electrode, a third emitter electrode connected to the third conductive line and spaced apart from the first emitter electrode with the second emitter electrode in-between, and a scattering part connecting the first and second emitter electrodes with each other.

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