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公开(公告)号：US10553659B2
公开(公告)日：2020-02-04
申请号：US15017742
申请日：2016-02-08
发明人： Joon Geol Kim , Si Joon Kim , Hee Seon Kim
IPC分类号： H01L27/32
摘要： An array test apparatus includes a signal transmission unit which transmits a data signal to each of a plurality of data lines of a low-temperature polysilicon (“LTPS”) substrate, a signal measurement unit which measures the data signal of each of the data lines of the LTPS substrate, a timer which generates a horizontal period for setting a section in which the data signal is transmitted from the signal transmission unit to each of the data lines and a section in which the data signal output from each of the data lines is measured by the signal measurement unit, and a determination unit which determines whether each of the data lines of the LTPS substrate is normal based on the data signal measured by the signal measurement unit.
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公开(公告)号：US11107866B2
公开(公告)日：2021-08-31
申请号：US16725280
申请日：2019-12-23
发明人： Joon Geol Kim , Si Joon Kim , Hee Seon Kim
IPC分类号： G01R31/00 , H01L27/32 , G09G3/3233 , G09G3/00
摘要： An array test apparatus includes a signal transmission unit which transmits a data signal to each of a plurality of data lines of a low-temperature polysilicon (“LTPS”) substrate, a signal measurement unit which measures the data signal of each of the data lines of the LTPS substrate, a timer which generates a horizontal period for setting a section in which the data signal is transmitted from the signal transmission unit to each of the data lines and a section in which the data signal output from each of the data lines is measured by the signal measurement unit, and a determination unit which determines whether each of the data lines of the LTPS substrate is normal based on the data signal measured by the signal measurement unit.
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