公开(公告)号：US20230232660A1

公开(公告)日：2023-07-20

申请号：US17891986

申请日：2022-08-19

Applicant: Samsung Display Co., Ltd.

Inventor： Kyongjun Kim ,  Yongbin Kim ,  Sohyun Shin ,  Gunwoo Yang ,  Dongjin Lee ,  Heejin Jeon ,  Hyunyoung Choi

IPC: H01L27/32 ,  G09G3/3233

CPC classification number: H01L27/326 ,  H01L27/3234 ,  H01L27/3272 ,  G09G3/3233 ,  G09G2300/0852 ,  G09G2300/0861 ,  G09G2300/0819 ,  G09G2300/0426 ,  G09G2320/0242 ,  G09G2320/0233

Abstract: A display apparatus includes a first pixel circuit and a second pixel circuit. The first pixel circuit includes a first driving transistor and a first storage capacitor having a first lower storage electrode connected to a gate of the first driving transistor and a first upper storage electrode overlapping the first lower storage electrode. The second pixel circuit includes a second driving transistor and a second storage capacitor including a second lower storage electrode connected to a gate of the second driving transistor and a second upper storage electrode overlapping the second lower storage electrode. A second overlapping area of the second lower storage electrode and the second upper storage electrode is about twice to about four times a first overlapping area of the first lower storage electrode and the first upper storage electrode.

公开(公告)号：US11282421B2

公开(公告)日：2022-03-22

申请号：US16818348

申请日：2020-03-13

Applicant: SAMSUNG DISPLAY CO., LTD.

Inventor： Gunwoo Yang ,  Yongbin Kim ,  Hyun Young Choi

IPC: G09G3/00 ,  G09G3/3241 ,  G09G3/3266

Abstract: A method of detecting a pixel defect for detecting a defect of a pixel including first to fourth transistors, connected to a data line, and receiving a scan signal and an initialization control signal includes turning on the first through fourth transistors by changing the scan signal and the initialization control signal to have a turn-on voltage level in an inspection period, detecting an inspecting current flowing in a path corresponding to the first through fourth transistors using a current detector that is connected to the data line, determining that a threshold voltage of the second transistor is within a normal range when the inspecting current is within a reference range, and determining that the threshold voltage of the second transistor is out of the normal range when the inspecting current is out of the reference range.