公开(公告)号：US10283036B2

公开(公告)日：2019-05-07

申请号：US15439563

申请日：2017-02-22

Applicant: Samsung Display Co., Ltd

Inventor： Jeong-Geun Yoo ,  In-Hwan Kim ,  Ji-Hwan Yoon ,  Hyun-Ho Lee

IPC: G06F1/00 ,  G09G3/20

Abstract: A luminance correction system includes an image pickup device configured to pick up a test image and generate pickup data, a parameter calculation device configured to calculate a first target luminance that is a maximum luminance of a reference area in a display panel and a detected maximum luminance that is a luminance of a correction target sub-pixel based on the pickup data with respect to a maximum grayscale, determine a second target luminance by correcting the first target luminance, and calculate correction parameters, and a display device including the display panel, the display device configured to compensate the input grayscale of the correction target sub-pixel to a target grayscale based on the correction parameters and generate a data voltage by adjusting upward a gamma voltage corresponding to the target grayscale.

公开(公告)号：US09514665B2

公开(公告)日：2016-12-06

申请号：US14190786

申请日：2014-02-26

Applicant: Samsung Display Co., Ltd.

Inventor： Kwang-Sae Lee ,  Jeong-Geun Yoo

IPC: G09G3/00 ,  G09G3/32

CPC classification number: G09G3/006 ,  G09G3/3225 ,  G09G2310/0297

Abstract: A test device for a display device including a plurality of demultiplexing switches connected to a plurality of data lines in accordance with the present invention includes: a one-sheet test device configured to include a plurality of control switches connected to the demultiplexing switches through a plurality of wires; and a wire test device configured to transmit wire test signals for detecting defects in the wires to a pad connected to the control switches. The wire test device transmits the wire test signals to the pad to detect defects in first wires of the wires and then detect defects in remaining second wires thereof, and the first wires and the second wires are alternatively disposed below the demultiplexing switches to constitute paths for signals transmitted to the demultiplexing switches.

Abstract translation: 根据本发明的包括连接到多个数据线的多个解复用开关的显示装置的测试装置包括：单片测试装置，被配置为包括通过多个连接到解复用开关的多个控制开关 的电线 以及线测试装置，其被配置为将用于检测所述导线中的缺陷的线测试信号传送到连接到所述控制开关的焊盘。 线测试装置将线测试信号发送到焊盘，以检测导线的第一线中的缺陷，然后检测其余第二线中的缺陷，并且第一线和第二线交替地设置在解复用开关下方，以构成用于 发送到解复用开关的信号。

公开(公告)号：US20150008937A1

公开(公告)日：2015-01-08

申请号：US14190786

申请日：2014-02-26

Applicant: Samsung Display Co., Ltd.

Inventor： Kwang-Sae LEE ,  Jeong-Geun Yoo

IPC: G01R31/02

CPC classification number: G09G3/006 ,  G09G3/3225 ,  G09G2310/0297

Abstract: A test device for a display device including a plurality of demultiplexing switches connected to a plurality of data lines in accordance with the present invention includes: a one-sheet test device configured to include a plurality of control switches connected to the demultiplexing switches through a plurality of wires; and a wire test device configured to transmit wire test signals for detecting defects in the wires to a pad connected to the control switches. The wire test device transmits the wire test signals to the pad to detect defects in first wires of the wires and then detect defects in remaining second wires thereof, and the first wires and the second wires are alternatively disposed below the demultiplexing switches to constitute paths for signals transmitted to the demultiplexing switches.

Abstract translation: 根据本发明的包括连接到多个数据线的多个解复用开关的显示装置的测试装置包括：单片测试装置，被配置为包括通过多个连接到解复用开关的多个控制开关 的电线 以及线测试装置，其被配置为将用于检测所述导线中的缺陷的线测试信号传送到连接到所述控制开关的焊盘。 线测试装置将线测试信号发送到焊盘，以检测导线的第一线中的缺陷，然后检测其余第二线中的缺陷，并且第一线和第二线交替地设置在解复用开关下方，以构成用于 发送到解复用开关的信号。