Apparatus and method for testing and debugging an integrated circuit
    1.
    发明授权
    Apparatus and method for testing and debugging an integrated circuit 有权
    用于集成电路测试和调试的装置和方法

    公开(公告)号:US07590911B1

    公开(公告)日:2009-09-15

    申请号:US11130995

    申请日:2005-05-17

    IPC分类号: G01R31/28

    摘要: An integrated circuit includes a first deserializer that deserializes serial data containing at least one of test instructions and/or data in a first format. A monitor module communicates with the first deserializer and interprets the test instructions and data using the first format. A frame capture module receives test results according to the interpreted test instructions and data. A first control module communicates with the frame capture module and generates first format control data. The frame capture module packages the test results and the first format control data into frames. A first serializer serializes the frames.

    摘要翻译: 集成电路包括反序列化包含第一格式的测试指令和/或数据中的至少一个的串行数据的第一解串器。 监视器模块与第一解串器通信,并使用第一格式解释测试指令和数据。 帧捕获模块根据解释的测试指令和数据接收测试结果。 第一控制模块与帧捕获模块通信并产生第一格式控制数据。 帧捕获模块将测试结果和第一格式控制数据打包成帧。 第一个串行器串行化帧。

    Apparatus and method for testing and debugging an integrated circuit

    公开(公告)号:US08356223B1

    公开(公告)日:2013-01-15

    申请号:US13446627

    申请日:2012-04-13

    IPC分类号: G01R31/28

    摘要: A system including a frame capture module, a serializer, and a deserializer. The frame capture module is configured to receive, from a device under test, data corresponding to test results, and package the data into first data frames. The serializer is configured serialize the first data frames to form serial messages that include serialized data. The serializer includes i) a first serial link configured to output the serial messages according to a first clock domain, and ii) a second serial link configured to output the serial messages according to a second clock domain. The deserializer is configured to deserialize the serial messages received on the first serial link and the second serial link to form second data frames.

    Apparatus and method for testing and debugging an integrated circuit
    3.
    发明授权
    Apparatus and method for testing and debugging an integrated circuit 有权
    用于集成电路测试和调试的装置和方法

    公开(公告)号:US07496818B1

    公开(公告)日:2009-02-24

    申请号:US11178807

    申请日:2005-07-11

    IPC分类号: G01R31/28

    摘要: A system is provided that retrieves test information from a target integrated circuit. A serializer receives the test information in a first format and divides and reformats the test information into first and second serial messages. The serializer is located on the target integrated circuit and has a first serial output that sends the first serial message and a second serial output that sends the second serial message. A deserializer communicates with the first and second serial outputs and receives the first and second serial messages. The deserializer retrieves a first portion of the test information from the first serial message, a second portion of the test information from the second serial message, and reconstructs the test information from the first portion and the second portion.

    摘要翻译: 提供一种从目标集成电路检索测试信息的系统。 串行器以第一格式接收测试信息,并将测试信息重新格式化为第一和第二串行消息。 串行器位于目标集成电路上,并具有发送第一串行消息的第一串行输出和发送第二串行消息的第二串行输出。 解串器与第一和第二串行输出通信,并接收第一和第二串行消息。 解串器从第一串行消息检索测试信息的第一部分,从第二串行消息检索测试信息的第二部分,并从第一部分和第二部分重建测试信息。

    Apparatus and method for testing and debugging an integrated circuit
    4.
    发明授权
    Apparatus and method for testing and debugging an integrated circuit 有权
    用于集成电路测试和调试的装置和方法

    公开(公告)号:US07496812B1

    公开(公告)日:2009-02-24

    申请号:US11131073

    申请日:2005-05-17

    摘要: An interface that communicates with first and second interface modules, an analyzer and an integrated circuit comprises a first path from the first and second interface modules and the analyzer to the integrated circuit. The first path includes a first serializer that serializes at least one of first control data and/or test data from at least one of the first and/or second interface modules. A second path from the integrated circuit to the first and second interface modules and the analyzer includes a high speed deserializer that deserializes serial data containing at least one of test result data and/or second control data from the integrated circuit. A frame sync module synchronizes data from the high speed deserializer to identify frames. The high speed deserializer outputs the second control data to at least one of the first and/or second interface modules. The frame sync module outputs the frames to the analyzer.

    摘要翻译: 与第一和第二接口模块,分析器和集成电路通信的接口包括从第一和第二接口模块和分析器到集成电路的第一路径。 第一路径包括第一串行器,其串行化来自第一和/或第二接口模块中的至少一个的第一控制数据和/或测试数据中的至少一个。 从集成电路到第一和第二接口模块和分析器的第二路径包括高速解串器,其将包含来自集成电路的测试结果数据和/或第二控制数据中的至少一个的串行数据反序列化。 帧同步模块将来自高速解串器的数据同步到识别帧。 高速解串器将第二控制数据输出到第一和/或第二接口模块中的至少一个。 帧同步模块将帧输出到分析仪。

    Apparatus and method for testing and debugging an integrated circuit
    5.
    发明授权
    Apparatus and method for testing and debugging an integrated circuit 有权
    用于集成电路测试和调试的装置和方法

    公开(公告)号:US07930604B1

    公开(公告)日:2011-04-19

    申请号:US12778225

    申请日:2010-05-12

    IPC分类号: G01R31/28

    摘要: A system for receiving serial messages from a device under test includes a deserializer configured to i) receive the serial messages and, ii) based on the serial messages, form data frames. A frame sync module is configured to form Joint Task Action Group (JTAG) data bits based on the data frames. A plurality of virtual JTAG test access ports are configured to i) receive the JTAG data bits and ii) shift the JTAG data bits between the plurality of virtual JTAG test access ports.

    摘要翻译: 用于从被测设备接收串行消息的系统包括配置为i)接收串行消息并且ii)基于串行消息形成数据帧的解串器。 帧同步模块被配置为基于数据帧形成联合任务动作组(JTAG)数据位。 多个虚拟JTAG测试访问端口被配置为i)接收JTAG数据位,以及ii)在多个虚拟JTAG测试访问端口之间移动JTAG数据位。

    Apparatus and method for testing and debugging an integrated circuit
    6.
    发明授权
    Apparatus and method for testing and debugging an integrated circuit 有权
    用于集成电路测试和调试的装置和方法

    公开(公告)号:US07444571B1

    公开(公告)日:2008-10-28

    申请号:US11065584

    申请日:2005-02-24

    IPC分类号: G01R31/28

    摘要: A system for testing a target integrated circuit comprises a host device that executes a debugging and testing analysis program, that transmits test instructions and data to the integrated circuit and that analyzes received data from the target integrated circuit. A first interface module communicates with the host device and formats the test instructions and data using a first format. A first serializer serializes the test instructions and data. A first deserializer on the target integrated circuit communicates with the first serializer and deserializes the test instructions and data. A control module on the target integrated circuit communicates with the first deserializer, interprets the test instructions and data using the first format. A testing module receives the interpreted test instructions and data from the control module and performs testing and debugging of the target integrated circuit.

    摘要翻译: 用于测试目标集成电路的系统包括执行调试和测试分析程序的主机设备,其将测试指令和数据发送到集成电路,并且分析来自目标集成电路的接收数据。 第一接口模块与主机设备进行通信,并使用第一格式格式化测试指令和数据。 第一个串行器序列化测试指令和数据。 目标集成电路上的第一个解串器与第一个串行器进行通信,反序列化测试指令和数据。 目标集成电路上的控制模块与第一解串器通信,使用第一格式解释测试指令和数据。 测试模块从控制模块接收解释的测试指令和数据,并执行目标集成电路的测试和调试。

    Apparatus and method for testing and debugging an integrated circuit
    7.
    发明授权
    Apparatus and method for testing and debugging an integrated circuit 有权
    用于集成电路测试和调试的装置和方法

    公开(公告)号:US08161336B1

    公开(公告)日:2012-04-17

    申请号:US13089660

    申请日:2011-04-19

    IPC分类号: G01R31/28

    摘要: A system receives serial messages from a device under test. The system includes a deserializer configured to i) receive the serial messages and, ii) based on the serial messages, form data frames. A frame sync module is configured to form Joint Task Action Group (JTAG) data bits based on the data frames. A plurality of virtual JTAG test access ports are configured to i) receive the JTAG data bits and ii) shift the JTAG data bits between the plurality of virtual JTAG test access ports.

    摘要翻译: 系统从被测设备接收串行消息。 该系统包括解串器,其被配置为i)接收串行消息,以及ii)基于串行消息形成数据帧。 帧同步模块被配置为基于数据帧形成联合任务动作组(JTAG)数据位。 多个虚拟JTAG测试访问端口被配置为i)接收JTAG数据位,以及ii)在多个虚拟JTAG测试访问端口之间移动JTAG数据位。

    Apparatus and method for testing and debugging an integrated circuit
    8.
    发明授权
    Apparatus and method for testing and debugging an integrated circuit 有权
    用于集成电路测试和调试的装置和方法

    公开(公告)号:US07721167B1

    公开(公告)日:2010-05-18

    申请号:US12154896

    申请日:2008-05-28

    IPC分类号: G01R31/28

    摘要: A system for receiving Joint Task Action Group (JTAG) data bits from a device under test includes a deserializer that receives serial messages from the device under test and forms data frames based on the serial messages. A frame sync module communicates with the deserializer and forms JTAG data bits based on the data frames. N virtual JTAG test access ports (VTAPs), each having an input and an output. The N VTAPs are connected in a daisy chain and the input of a first VTAP receives the JTAG data bits from the frame sync module.

    摘要翻译: 用于从被测设备接收联合任务动作组(JTAG)数据位的系统包括从串行消息接收来自被测器件的串行消息并形成数据帧的解串器。 帧同步模块与解串器通信,并根据数据帧形成JTAG数据位。 N个虚拟JTAG测试访问端口(VTAP),每个具有输入和输出。 N个VTAP以菊花链方式连接,第一个VTAP的输入端从帧同步模块接收JTAG数据位。