公开(公告)号：US20160033404A1

公开(公告)日：2016-02-04

申请号：US14418895

申请日：2013-10-03

Applicant: SYSTEM SQUARE INC.

Inventor： Atsushi Suzuki ,  Noriaki Ikeda

IPC: G01N21/59 ,  G01V5/00 ,  G01V11/00

CPC classification number: G01V5/0016 ,  G01N21/3581 ,  G01V8/10 ,  G01V11/00

Abstract: A package inspection system is provided, where an electromagnetic-wave detection part is hardly affected by illumination light for optical detection. Below a gap 6c of a conveyor mechanism 6 for conveying a package, provided are an X-ray sensor 13 for detecting X rays transmitted through the package and an illumination part 16 for applying illumination light to the gap 6c. The X-ray sensor 13 and the illumination part 16 are separated from each other by a partition 42. A light-shielding member 43 is placed in the path of X-ray incidence to the X-ray sensor 13. The light-shielding member 43 is formed of a material that allows passage of the X rays but does not allow passage of the illumination light and is hardly deteriorated by irradiation of the X rays, e.g., a carbon sheet.

Abstract translation: 提供一种封装检查系统，其中电磁波检测部分几乎不受用于光学检测的照明光的影响。 在用于传送包装的传送机构6的间隙6c的下方设置有用于检测透过包装的X射线的X射线传感器13和用于向间隙6c施加照明光的照明部16。 X射线传感器13和照明部16通过分隔部42彼此分离。在X射线入射到X射线传感器13的路径中设置遮光部件43.遮光部件 43由允许X射线通过但不允许照明光通过并且几乎不会因X射线（例如碳片）的照射而劣化的材料形成。

公开(公告)号：US09733384B2

公开(公告)日：2017-08-15

申请号：US14418895

申请日：2013-10-03

Applicant: System Square Inc.

Inventor： Atsushi Suzuki ,  Noriaki Ikeda

IPC: G01N21/59 ,  G01N21/3581 ,  G01V5/00 ,  G01V8/10 ,  G01V11/00

CPC classification number: G01V5/0016 ,  G01N21/3581 ,  G01V8/10 ,  G01V11/00

Abstract: A package inspection system is provided, where an electromagnetic-wave detection part is hardly affected by illumination light for optical detection. Below a gap 6c of a conveyor mechanism 6 for conveying a package, provided are an X-ray sensor 13 for detecting X rays transmitted through the package and an illumination part 16 for applying illumination light to the gap 6c. The X-ray sensor 13 and the illumination part 16 are separated from each other by a partition 42. A light-shielding member 43 is placed in the path of X-ray incidence to the X-ray sensor 13. The light-shielding member 43 is formed of a material that allows passage of the X rays but does not allow passage of the illumination light and is hardly deteriorated by irradiation of the X rays, e.g., a carbon sheet.