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公开(公告)号:US20220318985A1
公开(公告)日:2022-10-06
申请号:US17631423
申请日:2021-03-24
Applicant: System Square Inc.
Inventor: Sachihiro NAKAGAWA
Abstract: A training data generation device includes: cut-out unit that receives an input of an image of an inspection target, specifies an inspection area of the inspection target in the image by a predetermined method, and cuts out the specified inspection area from the image; sorting unit that, on the basis of a sorting operation of sorting, as a learning-target image, an image of the inspection area cut out in the cut-out unit into at least either normal or non-normal, associates the learning-target image and a result of the sorting with each other; and training data memory unit that stores training data in which the learning-target image and the result of the sorting are associated with each other.
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公开(公告)号:US20150241341A1
公开(公告)日:2015-08-27
申请号:US14680460
申请日:2015-04-07
Applicant: System Square Inc.
Inventor: Noriaki IKEDA
IPC: G01N21/3581 , H04N5/33 , H04N5/32 , G01V5/00 , G01N21/84
CPC classification number: G01N21/3581 , B65B57/10 , G01N21/84 , G01N21/90 , G01N23/10 , G01N33/02 , G01N2021/845 , G01V5/0016 , H04N5/32 , H04N5/33
Abstract: A package inspection system includes a conveyor mechanism 6, an X-ray generator 10 applying X rays to a package W1 conveyed by the conveyor mechanism 6, an X-ray sensor 13, and an optical sensor 15. First image data showing the outline of the content of the package W1 are generated based on detection output from the X-ray sensor 13. Second image data showing the outline of the wrapping of the package W1 are generated based on detection output from an optical sensor 15. The relative position of the wrapping and the content is determined based on the first and second image data, so that failures, e.g., the content caught in a seal of the wrapping can be detected accurately. The package inspection system can accurately determine a position of a wrapping and the content of a package even if a package has a light non-transmissive wrapping.
Abstract translation: 包装检查系统包括输送机构6,将X射线施加到由输送机构6输送的包装W1,X射线传感器13和光学传感器15的X射线发生器10。 根据来自X射线传感器13的检测输出来生成包装W1的内容。基于来自光学传感器15的检测输出,生成表示包装W1的包装轮廓的第二图像数据。 并且基于第一和第二图像数据确定内容,使得可以准确地检测到诸如被卷入包装的密封件中的内容的故障。 包装检查系统可以精确地确定包装的位置和包装的内容物,即使包装具有轻的非透明包装。
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公开(公告)号:US20220067434A1
公开(公告)日:2022-03-03
申请号:US17281228
申请日:2019-09-20
Applicant: SYSTEM SQUARE INC.
Inventor: Sachihiro NAKAGAWA
Abstract: A training data generation device that can rapidly generate a large amount of training data to be input into a learning program is provided. The training data generation device generates training data to be used in machine learning. A learned model generated by the machine learning using the training data generated by the training data generation device is used in an inspection device that performs inspection for determining whether or not an inspection target is a normal product by inputting an image capturing the inspection target into the learned model. The training data generation device includes the following: a determination-target image extraction unit that extracts, from an input image capturing the inspection target, one or more determination-target images containing a determination target that satisfies a predetermined condition; a sorting unit that associates, on the basis of a sorting operation of sorting the inspection target captured in the determination-target image into either a normal product or a non-normal product, each of the determination-target images and a result of the sorting with each other; and a training data memory unit that stores training data in which each of the determination-target images and a result of the sorting are associated with each other.
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公开(公告)号:US20190212464A1
公开(公告)日:2019-07-11
申请号:US16334350
申请日:2017-09-20
Applicant: System Square Inc.
Inventor: Noriaki IKEDA , Sachihiro NAKAGAWA
IPC: G01V5/00
CPC classification number: G01V5/0016 , G01N23/04 , G01N23/18 , G01T1/17 , G01T1/36
Abstract: An X-ray inspection apparatus includes: an X-ray emission unit for emitting an X-ray to an object; an X-ray detection unit for detecting each X-ray photon transmitted through the object by discriminating energy possessed by the photon into one or more energy region(s) in accordance with a predetermined threshold level; a storage unit for storing the object and the associated threshold level; a threshold level setting unit for referring to the storage unit to keep a threshold level for the object specified by inputted information so that the X-ray detection unit can refer to the threshold level as the predetermined threshold level; and an inspection unit for inspecting the object based on a number of photons or an amount corresponding to the number of the photons detected by the X-ray detection unit for each of the one or more energy region(s).
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公开(公告)号:US20160033404A1
公开(公告)日:2016-02-04
申请号:US14418895
申请日:2013-10-03
Applicant: SYSTEM SQUARE INC.
Inventor: Atsushi Suzuki , Noriaki Ikeda
CPC classification number: G01V5/0016 , G01N21/3581 , G01V8/10 , G01V11/00
Abstract: A package inspection system is provided, where an electromagnetic-wave detection part is hardly affected by illumination light for optical detection. Below a gap 6c of a conveyor mechanism 6 for conveying a package, provided are an X-ray sensor 13 for detecting X rays transmitted through the package and an illumination part 16 for applying illumination light to the gap 6c. The X-ray sensor 13 and the illumination part 16 are separated from each other by a partition 42. A light-shielding member 43 is placed in the path of X-ray incidence to the X-ray sensor 13. The light-shielding member 43 is formed of a material that allows passage of the X rays but does not allow passage of the illumination light and is hardly deteriorated by irradiation of the X rays, e.g., a carbon sheet.
Abstract translation: 提供一种封装检查系统,其中电磁波检测部分几乎不受用于光学检测的照明光的影响。 在用于传送包装的传送机构6的间隙6c的下方设置有用于检测透过包装的X射线的X射线传感器13和用于向间隙6c施加照明光的照明部16。 X射线传感器13和照明部16通过分隔部42彼此分离。在X射线入射到X射线传感器13的路径中设置遮光部件43.遮光部件 43由允许X射线通过但不允许照明光通过并且几乎不会因X射线(例如碳片)的照射而劣化的材料形成。
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公开(公告)号:US09865424B2
公开(公告)日:2018-01-09
申请号:US14642736
申请日:2015-03-09
Applicant: System Square Inc.
Inventor: Noriaki Ikeda , Kazunori Yamada
CPC classification number: H01J35/16 , G01N23/04 , G01N2223/652 , G01V5/0016 , H01J35/025 , H01J2235/127 , H05G1/025
Abstract: An X-ray inspection system of the present application is capable of blocking the effect of heat from an X-ray source, thereby making it possible to place a heat-sensitive circuit component in the same housing space as the X-ray source. The X-ray inspection system includes a housing 10 provided with an upper housing space 11, in which an X-ray source 32 housed in a cooling container 30 is placed. Due to pressure of a pump 36, a cooling medium circulates between the cooling container 30 and a heat radiating device 33, thereby suppressing the temperature rise of the cooling container 30. Since the cooling container 30 is placed in the upper housing space 11, the upper housing space 11 serves as a cooling space, suppressing the temperature rise. Therefore, heat-sensitive or heat-producing circuit components can be placed in the upper housing space 11.
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公开(公告)号:US09733384B2
公开(公告)日:2017-08-15
申请号:US14418895
申请日:2013-10-03
Applicant: System Square Inc.
Inventor: Atsushi Suzuki , Noriaki Ikeda
IPC: G01N21/59 , G01N21/3581 , G01V5/00 , G01V8/10 , G01V11/00
CPC classification number: G01V5/0016 , G01N21/3581 , G01V8/10 , G01V11/00
Abstract: A package inspection system is provided, where an electromagnetic-wave detection part is hardly affected by illumination light for optical detection. Below a gap 6c of a conveyor mechanism 6 for conveying a package, provided are an X-ray sensor 13 for detecting X rays transmitted through the package and an illumination part 16 for applying illumination light to the gap 6c. The X-ray sensor 13 and the illumination part 16 are separated from each other by a partition 42. A light-shielding member 43 is placed in the path of X-ray incidence to the X-ray sensor 13. The light-shielding member 43 is formed of a material that allows passage of the X rays but does not allow passage of the illumination light and is hardly deteriorated by irradiation of the X rays, e.g., a carbon sheet.
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公开(公告)号:US10859516B2
公开(公告)日:2020-12-08
申请号:US16334350
申请日:2017-09-20
Applicant: System Square Inc.
Inventor: Noriaki Ikeda , Sachihiro Nakagawa
IPC: G01N23/04 , G01N23/087 , G01T1/24 , G01N23/18
Abstract: An X-ray inspection apparatus includes: an X-ray emission unit for emitting an X-ray to an object; an X-ray detection unit for detecting each X-ray photon transmitted through the object by discriminating energy possessed by the photon into one or more energy region(s) in accordance with a predetermined threshold level; a storage unit for storing the object and the associated threshold level; a threshold level setting unit for referring to the storage unit to keep a threshold level for the object specified by inputted information so that the X-ray detection unit can refer to the threshold level as the predetermined threshold level; and an inspection unit for inspecting the object based on a number of photons or an amount corresponding to the number of the photons detected by the X-ray detection unit for each of the one or more energy region(s).
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公开(公告)号:US20200241150A1
公开(公告)日:2020-07-30
申请号:US16756843
申请日:2017-10-24
Applicant: System Square Inc.
Inventor: Noriaki IKEDA , Junji MORIYAMA
IPC: G01T1/16 , H01L27/146 , G01T1/29
Abstract: An electromagnetic wave detection module in which wiring is formed to connect each detection element of an electromagnetic wave detection means configured by arranging a plurality of detection elements for detecting an electromagnetic wave in a two-dimensional array and a predetermined connection destination outside the electromagnetic wave detection means with good manufacturability and so as not to cause trouble in the detection of an electromagnetic wave as much as possible. A detection element group includes M detection elements (M is an integer of 2 or more) arranged in the Y-axis direction is arranged in N rows (N is an integer of 2 or more) in the X-axis direction orthogonal to the Y-axis direction, and M×N wirings electrically connecting each of the M×N detection elements and a predetermined connection destination outside any one end of the electromagnetic wave detection means in the Y-axis direction are provided on the common substrate surface.
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公开(公告)号:US09541499B2
公开(公告)日:2017-01-10
申请号:US14680460
申请日:2015-04-07
Applicant: System Square Inc.
Inventor: Noriaki Ikeda
IPC: G01N21/3581 , G01N21/90 , G01N23/10 , G01N21/84 , G01V5/00 , H04N5/32 , H04N5/33 , B65B57/10 , G01N33/02
CPC classification number: G01N21/3581 , B65B57/10 , G01N21/84 , G01N21/90 , G01N23/10 , G01N33/02 , G01N2021/845 , G01V5/0016 , H04N5/32 , H04N5/33
Abstract: A package inspection system includes a conveyor mechanism 6, an X-ray generator 10 applying X rays to a package W1 conveyed by the conveyor mechanism 6, an X-ray sensor 13, and an optical sensor 15. First image data showing the outline of the content of the package W1 are generated based on detection output from the X-ray sensor 13. Second image data showing the outline of the wrapping of the package W1 are generated based on detection output from an optical sensor 15. The relative position of the wrapping and the content is determined based on the first and second image data, so that failures, e.g., the content caught in a seal of the wrapping can be detected accurately. The package inspection system can accurately determine a position of a wrapping and the content of a package even if a package has a light non-transmissive wrapping.
Abstract translation: 包装检查系统包括输送机构6,将X射线施加到由输送机构6输送的包装W1,X射线传感器13和光学传感器15的X射线发生器10。 根据来自X射线传感器13的检测输出来生成包装W1的内容。基于来自光学传感器15的检测输出,生成表示包装W1的包装轮廓的第二图像数据。 并且基于第一和第二图像数据确定内容,使得可以准确地检测到诸如被卷入包装的密封件中的内容的故障。 包装检查系统可以精确地确定包装的位置和包装的内容物,即使包装具有轻的非透明包装。
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