公开(公告)号：US11595002B2

公开(公告)日：2023-02-28

申请号：US16770536

申请日：2018-12-12

Applicant: SUMITOMO ELECTRIC INDUSTRIES, LTD.

Inventor： Takashi Iwasaki ,  Koji Mori ,  Kenji Saito ,  Kazushi Iyatani ,  Yoshikazu Kogetsu

IPC: H02S50/15 ,  H02S20/32 ,  H02S40/22

Abstract: This method for detecting a poor module-mounting-state in a concentrator photovoltaic apparatus includes: photographing a surface of an array by an imaging device; obtaining an image in which a virtual image, magnified through a condenser lens, of a light receiving portion including a cell and a vicinity thereof is formed, and a collection of pixels of the virtual image forms a composite virtual image of an entirety of the light receiving portion, the composite virtual image being projected over a plurality of modules; and detecting a poor module-mounting-state based on a form of the composite virtual image.