Methods and devices for testing comparators

    公开(公告)号:US11209482B1

    公开(公告)日:2021-12-28

    申请号:US17107370

    申请日:2020-11-30

    Abstract: A device for a system on a chip (SOC), the device includes: a comparator that includes a first input port, a second input port, and an output port. A first input signal and a second input signal are split into N bit pairs that include one bit from the first input signal and one bit from the second input signal. The comparator is configured so a mismatch between the first input signal and the second input signal causes an output signal to assume a first expected state. The device further comprises a test controller to perform a first operability test by mismatching the N bit pairs and verifying that the output signal assumes the first expected state.

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