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公开(公告)号:US20240421024A1
公开(公告)日:2024-12-19
申请号:US18816920
申请日:2024-08-27
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: KyungOe Kim , Wagno Alves Braganca, JR. , DongSam Park
IPC: H01L23/367 , H01L21/48 , H01L21/56 , H01L23/00 , H01L23/31 , H01L23/498
Abstract: A semiconductor device has a heat spreader with an opening formed through the heat spreader. The heat spreader is disposed over a substrate with a semiconductor die disposed on the substrate in the opening. A thermally conductive material, e.g., adhesive or an elastomer plug, is disposed in the opening between the heat spreader and semiconductor die. A conductive layer is formed over the substrate, heat spreader, and thermally conductive material.
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公开(公告)号:US11823973B2
公开(公告)日:2023-11-21
申请号:US17451036
申请日:2021-10-15
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: DongSam Park , KyungOe Kim , WooJin Lee
IPC: H01L23/367 , H01L25/00 , H01L25/16 , H01L25/065 , H01L23/552 , H01L23/00
CPC classification number: H01L23/3675 , H01L23/552 , H01L25/0655 , H01L25/16 , H01L25/50 , H01L24/16 , H01L2224/16225
Abstract: A semiconductor device has a substrate and two semiconductor die disposed over the substrate. A thermal interface material is disposed over the semiconductor die. A conductive epoxy is disposed on a ground pad of the substrate. A lid is disposed over the semiconductor die. The lid includes a sidewall over the ground pad between the semiconductor die. The lid physically contacts the conductive epoxy and thermal interface material.
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公开(公告)号:US20220415744A1
公开(公告)日:2022-12-29
申请号:US17304659
申请日:2021-06-24
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: KyungOe Kim , Wagno Alves Braganca, JR. , DongSam Park
IPC: H01L23/367 , H01L23/31 , H01L23/498 , H01L23/00 , H01L21/48 , H01L21/56
Abstract: A semiconductor device has a heat spreader with an opening formed through the heat spreader. The heat spreader is disposed over a substrate with a semiconductor die disposed on the substrate in the opening. A thermally conductive material, e.g., adhesive or an elastomer plug, is disposed in the opening between the heat spreader and semiconductor die. A conductive layer is formed over the substrate, heat spreader, and thermally conductive material.
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公开(公告)号:US12107028B2
公开(公告)日:2024-10-01
申请号:US18305913
申请日:2023-04-24
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: KyungOe Kim , Wagno Alves Braganca, Jr. , DongSam Park
IPC: H01L23/367 , H01L21/48 , H01L21/56 , H01L23/00 , H01L23/31 , H01L23/498
CPC classification number: H01L23/367 , H01L21/4853 , H01L21/4857 , H01L21/4871 , H01L21/565 , H01L23/3185 , H01L23/49816 , H01L23/49822 , H01L24/16 , H01L2224/16227 , H01L2924/15311 , H01L2924/18161
Abstract: A semiconductor device has a heat spreader with an opening formed through the heat spreader. The heat spreader is disposed over a substrate with a semiconductor die disposed on the substrate in the opening. A thermally conductive material, e.g., adhesive or an elastomer plug, is disposed in the opening between the heat spreader and semiconductor die. A conductive layer is formed over the substrate, heat spreader, and thermally conductive material.
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公开(公告)号:US20230260865A1
公开(公告)日:2023-08-17
申请号:US18305913
申请日:2023-04-24
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: KyungOe Kim , Wagno Alves Braganca, JR. , DongSam Park
IPC: H01L23/367 , H01L23/31 , H01L23/498 , H01L23/00 , H01L21/48 , H01L21/56
CPC classification number: H01L23/367 , H01L21/565 , H01L21/4853 , H01L21/4857 , H01L21/4871 , H01L23/3185 , H01L23/49816 , H01L23/49822 , H01L24/16 , H01L2224/16227 , H01L2924/15311 , H01L2924/18161
Abstract: A semiconductor device has a heat spreader with an opening formed through the heat spreader. The heat spreader is disposed over a substrate with a semiconductor die disposed on the substrate in the opening. A thermally conductive material, e.g., adhesive or an elastomer plug, is disposed in the opening between the heat spreader and semiconductor die. A conductive layer is formed over the substrate, heat spreader, and thermally conductive material.
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公开(公告)号:US11670563B2
公开(公告)日:2023-06-06
申请号:US17304659
申请日:2021-06-24
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: KyungOe Kim , Wagno Alves Braganca, Jr. , DongSam Park
IPC: H01L23/367 , H01L23/31 , H01L23/498 , H01L23/00 , H01L21/48 , H01L21/56
CPC classification number: H01L23/367 , H01L21/4853 , H01L21/4857 , H01L21/4871 , H01L21/565 , H01L23/3185 , H01L23/49816 , H01L23/49822 , H01L24/16 , H01L2224/16227 , H01L2924/15311 , H01L2924/18161
Abstract: A semiconductor device has a heat spreader with an opening formed through the heat spreader. The heat spreader is disposed over a substrate with a semiconductor die disposed on the substrate in the opening. A thermally conductive material, e.g., adhesive or an elastomer plug, is disposed in the opening between the heat spreader and semiconductor die. A conductive layer is formed over the substrate, heat spreader, and thermally conductive material.
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公开(公告)号:US20230119942A1
公开(公告)日:2023-04-20
申请号:US17451036
申请日:2021-10-15
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: DongSam Park , KyungOe Kim , WooJin Lee
IPC: H01L23/367 , H01L25/00 , H01L25/16 , H01L23/552 , H01L25/065
Abstract: A semiconductor device has a substrate and two semiconductor die disposed over the substrate. A thermal interface material is disposed over the semiconductor die. A conductive epoxy is disposed on a ground pad of the substrate. A lid is disposed over the semiconductor die. The lid includes a sidewall over the ground pad between the semiconductor die. The lid physically contacts the conductive epoxy and thermal interface material.
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