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公开(公告)号：US3754829A
公开(公告)日：1973-08-28
申请号：US3754829D
申请日：1971-08-19
Applicant: SPECTRX CO
Inventor： HOYTE J , HOLLENBECK K
CPC classification number: G01J3/28
Abstract: The spectral lines associated with a sample of material under examination are deflected from their normal optical path by an angle which varies logarithmically with time toward a sheet of photographic film. The film is thereby exposed to provide a photographic image of the spectral lines which taper in intensity toward nonexposure, and the length of the line or lines is thus representative of the concentration of an element present in the sample under examination.
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