公开(公告)号：US11037648B2

公开(公告)日：2021-06-15

申请号：US16051796

申请日：2018-08-01

申请人： SK hynix Inc.

发明人： Tae Sik Yun ,  Chun Seok Jeong

IPC分类号： G06F11/27 ,  G11C29/44 ,  G11C29/42 ,  G11C29/36 ,  G06F11/263

摘要： A memory system and a method for operating the same, wherein the memory system includes a first memory and a second memory each configured to store data. The memory system further includes a test and repair circuit operationally connected to the first memory and to the second memory. The test and repair circuit is configured to receive a test initiation signal and perform, in response to receiving the test initiation signal, a test operation on at least one of the first memory and the second memory. The test and repair circuit is also configured to perform, based on a result of the test operation, a repair operation on the at least one of the first memory and the second memory.

公开(公告)号：US11664087B2

公开(公告)日：2023-05-30

申请号：US17490443

申请日：2021-09-30

申请人： SK hynix Inc.

发明人： A Ram Rim ,  Tae Sik Yun

IPC分类号： G11C29/00

CPC分类号： G11C29/808 ,  G11C29/785 ,  G11C29/846

摘要： A semiconductor device includes a memory bank including a first memory block, a second memory block, and a redundancy memory block, and a column line selection circuit configured, when a fail occurs in a first column line of the first memory block, to replace the first column line of the first memory block with a first redundancy line of the redundancy memory block, and replace a second column line of the second memory block with a second redundancy line of the redundancy memory block.

公开(公告)号：US09583172B1

公开(公告)日：2017-02-28

申请号：US15059524

申请日：2016-03-03

申请人： SK hynix Inc.

发明人： Tae Sik Yun ,  Dong Beom Lee

IPC分类号： G11C11/406 ,  G11C11/4076

CPC分类号： G11C11/40615 ,  G11C11/4076

摘要： A self-refresh control device may be provided. The self-refresh control device may include a refresh signal output circuit configured to generate self-refresh signals with an oscillator and provide a refresh signal. The self-refresh control device may begin a self-refresh mode in response to a clock enable signal and a self-refresh signal within a self-refresh entry period, and may prevent performance of a new self-refresh operation by delaying an additional self-refresh signal until after the self-refresh entry period has ended.

摘要翻译： 可以提供自刷新控制装置。 自刷新控制装置可以包括被配置为利用振荡器产生自刷新信号并提供刷新信号的刷新信号输出电路。 自刷新控制装置可以响应于自刷新进入周期内的时钟使能信号和自刷新信号而开始自刷新模式，并且可以通过延迟额外的自身来防止新的自刷新操作的执行 - 自动刷新信号，直到自刷新进入周期结束。

公开(公告)号：US09171604B2

公开(公告)日：2015-10-27

申请号：US14243651

申请日：2014-04-02

申请人： SK hynix Inc.

发明人： Sang Mook Oh ,  Tae Sik Yun

IPC分类号： G11C11/406 ,  G11C8/10 ,  G11C29/04 ,  G11C8/00 ,  G11C8/18 ,  G11C8/04 ,  G11C11/4072 ,  G11C29/00 ,  G11C11/408

CPC分类号： G11C11/406 ,  G11C8/04 ,  G11C8/18 ,  G11C11/4072 ,  G11C11/4087 ,  G11C29/04 ,  G11C29/783 ,  G11C2029/4402 ,  G11C2211/4065

摘要： A refresh control circuit of a semiconductor apparatus includes a repair address processing unit configured to compare refresh addresses and repair information, activate a redundant enable signal, and convert the semiconductor apparatus into the same operation state as an initialization state of the repair information in response to activation of a repair initialization signal; a refresh counter configured to count the refresh addresses extended to a signal bit in response to activation of a redundant count enable signal; and a refresh control unit configured to activate the repair initialization signal and the redundant count enable signal when an additional refresh mode is set in response to a refresh command.

摘要翻译： 半导体装置的刷新控制电路包括修复地址处理单元，被配置为比较刷新地址和修复信息，激活冗余使能信号，并且将半导体装置转换为与修复信息的初始化状态相同的操作状态，以响应于 激活修复初始化信号; 刷新计数器，配置为响应于冗余计数使能信号的激活而对扩展到信号位的刷新地址进行计数; 以及刷新控制单元，被配置为当响应于刷新命令设置附加刷新模式时，激活修复初始化信号和冗余计数使能信号。

公开(公告)号：US09576936B2

公开(公告)日：2017-02-21

申请号：US14981284

申请日：2015-12-28

申请人： SK hynix Inc.

发明人： Tae Sik Yun ,  Sang Jin Byeon

IPC分类号： H03K19/00 ,  H01L25/065 ,  H03K19/003 ,  H03K17/14 ,  G01R31/28

CPC分类号： H01L25/0657 ,  G01R31/2882 ,  H01L2224/16 ,  H01L2224/16145 ,  H01L2225/06513 ,  H01L2225/06541 ,  H01L2225/06544 ,  H03K17/14 ,  H03K19/00369 ,  Y10T307/826

摘要： A semiconductor apparatus includes: a slave chip including a signal transfer unit configured to determine whether or not to transfer an input signal in response to a chip select signal; a master chip including a replica circuit unit having the same configuration as the signal transfer unit and a signal output unit configured to receive an output signal of the signal transfer unit and an output signal of the replica circuit unit and generate an output signal in response to the control signal; a first through-chip via vertically formed through the slave chip, and having one end connected to the master chip to receive the input signal and the other end connected to the signal transfer unit; and a second through-chip via vertically formed through the slave chip, and having one end connected to the signal transfer unit and the other end connected to the signal output unit.

摘要翻译： 半导体装置包括：从芯片，包括信号传送单元，配置为响应于芯片选择信号确定是否传送输入信号; 包括具有与信号传送单元相同配置的复制电路单元的主芯片和被配置为接收信号传送单元的输出信号和复制电路单元的输出信号的信号输出单元，并响应于 控制信号; 通过垂直形成的从芯片的第一通芯片，并且一端连接到主芯片以接收输入信号，另一端连接到信号传送单元; 以及通过垂直形成的从芯片的第二通芯片，并且其一端连接到信号传送单元，另一端连接到信号输出单元。

公开(公告)号：US09082467B2

公开(公告)日：2015-07-14

申请号：US14590503

申请日：2015-01-06

申请人： SK hynix Inc.

发明人： Tae Sik Yun ,  Dong Hwee Kim

IPC分类号： G11C8/08 ,  G11C5/02

CPC分类号： G11C8/08 ,  G11C5/02 ,  G11C11/4085 ,  G11C11/4097

摘要： A sub word line driver and a semiconductor integrated circuit device having the same are provided. The semiconductor integrated circuit device includes adjacent four sub word line drivers configured to drive four sub word lines in response to signals of four main word lines, wherein first and second sub word line drivers of adjacent sub word line drivers share one keeper transistor with each other, and third and fourth sub word line drivers of the adjacent sub word line drivers share one keeper transistor with each other.