摘要:
The purpose of the present invention is to provide a shot peening apparatus for which size increase is limited by projecting a shot material evenly on a workpiece using a single projector. The present invention provides a shot peening apparatus equipped with a workpiece-conveying mechanism for conveying a workpiece and a projector for projecting a shot material at the workpiece. The workpiece-conveying mechanism is equipped with: a pair of rollers, which extend in the workpiece conveyance direction, on which the workpieces are loaded, and which are rotated centered on the longitudinal axis line; an endless chain; and conveyance members for pressing and conveying workpieces in the conveyance direction. The projector is a centrifugal projector and is equipped with: a control cage into which the shot material is supplied and in which a first opening and a second opening are formed; and a bladed wheel, which is provided with multiple blades having a backward-sloping section that slopes toward the back in the rotation direction and which rotates centered on the central axis line of the control cage. The first opening and the second opening of the control cage are separated from each other in the circumferential direction of the control cage and are disposed offset from each other in the direction of the central axis line of the control cage.
摘要:
A metal detecting device includes: a transfer section that transfers an inspection target object, along a path that passes between a first magnet and a second magnet; a first magnetic sensor that is arranged so as to be aligned with the first magnet and that outputs a first signal; and a second magnetic sensor that is arranged so as to be aligned with the second magnet and that outputs a second signal, whether or not the inspection target object contains metal being determined on the basis of strength of the first signal and a phase difference between the first signal and the second signal.
摘要:
To provide a surface property inspection device and method capable of inspecting the surface treatment state of treated material subjected to surface treatments. A surface property inspection device 1 includes an AC power supply 10, an AC bridge circuit 20, and an evaluation apparatus 30, and the AC bridge circuit 20 is formed by a variable resistor 21 with a distribution ratio of γ, a reference detector 22, and an inspection detector 23. The inspection detector 23 includes a coil 23b wound so as to oppose the surface property inspection area of the test object M; an eddy current is excited in the test object M by supplying AC power to the coil 23b. A reference test object S with the same structure as the test object M is placed in the reference detector 22 to cancel inspection environment effects.
摘要:
The purpose of the present invention is to provide a shot processing device and a projector such that the projection amount of a projection material can be minimized. The present invention provides a shot processing device equipped with a centrifugal projector for projecting a projection material onto a workpiece and a support mechanism for supporting the workpiece at a processing position where surface processing by the projector can be carried out, wherein the projector is equipped with: a cylindrical control cage which the projection material is supplied into and which has an opening formed on a side wall as a projection material discharge port; and an impeller that has a plurality of blades, which are arranged outside of the control cage and extend outward in the radial direction of the control cage, and rotates about the central axis of the control cage, wherein each blade has, disposed on a front-side surface in the rotation direction, a rearward inclined section inclining toward the rear-side in the rotation direction.
摘要:
The present invention provides a surface property inspection method and apparatus for inspecting the surface properties of a test object subjected to two stages of shot peening. The present invention is an apparatus 1 includes an AC power supply, an AC bridge circuit, and an evaluation apparatus. The AC bridge circuit is constituted by a variable resistor, a reference detector and inspection detector. The inspection detector includes a coil wound so as to oppose the surface property inspection area of the test object M; an eddy current is excited in the test object M by supplying AC power to the coil. A pass/fail judgment of the first shot peening can be made by inspecting the surface properties of a test object subjected to a second shot peening only after the second shot peening is completed.
摘要:
The purpose of the present invention is to provide a drum-type shot peening device capable of shortening processing time. This shot peening device comprises: a bottomed, cylindrical drum having one end thereof open; and a projector provided on the open side of the drum and which projects projection material on to a workpiece inserted inside the drum. The projector comprises: a cylindrical control gauge having an opening window that is formed in the side wall thereof and serves as a discharge port for the projection material, said opening window having a rectangular shape having two sides thereof parallel to the center axis of the control gauge having the projection material supplied therein; and an impeller comprising a plurality of blades arranged on the outside of the control gauge so as to extend in the radial outside direction of the control gauge, said impeller rotating around the center axis of the control gauge and having a backward-tilting section that is tilted towards the rear side in the blade rotation direction and is provided on the surface on the front side in the rotation direction.
摘要:
To provide a surface property inspection apparatus, surface property inspection system, and surface property inspection method capable of inspecting the surface processing state of processed material subjected to surface processing such as shot-peening, heat treatment, or nitriding with high accuracy and low vulnerability to temperature changes in the inspection environment. Surface property inspection apparatus is furnished with a AC power supply, a AC bridge circuit, and an evaluation device; AC bridge circuit comprises variable resistor with which distribution ratio γ is variable, reference detector, and inspection detector. Inspection detector is furnished with a coil wound so as to oppose the surface property inspection region of object under inspection M, and by supplying AC power from AC power supply to coil, an eddy current is excited in object under inspection M. Thus the magnetic properties of object under inspection M can be detected, and inspection of surface properties based on the output signal from AC power supply is possible.