公开(公告)号：US20230236111A1

公开(公告)日：2023-07-27

申请号：US18077213

申请日：2022-12-07

Applicant: SHIMADZU CORPORATION

Inventor： Takahide HATAHORI ,  Kenji TAKUBO ,  Tomotaka NAGASHIMA

IPC: G01N21/17 ,  G01N21/88

CPC classification number: G01N21/1702 ,  G01N21/88 ,  G01N2021/1706

Abstract: In a defect detection device (10), an input receiver (161) receives an input, by a user, of information concerning the kind and size of a defect expected to be present in or on a test object. An exciter (11, 12) induces an elastic wave in the test object, with the frequency of the elastic wave being variable. A measurer (15) optically measures a vibration state of the surface of the test object caused by the elastic wave. A wavelength determiner (164) determines the wavelength of the elastic wave induced in the test object, based on the vibration state obtained by the measurer. A frequency selector (165) selects an appropriate frequency from a plurality of frequencies, based on the kind and size of the expected defect as well as the wavelength acquired for each of the plurality of frequencies by the wavelength determiner by varying the frequency of the elastic wave.

公开(公告)号：US20250005786A1

公开(公告)日：2025-01-02

申请号：US18691356

申请日：2022-07-08

Applicant: SHIMADZU CORPORATION

Inventor： Tomotaka NAGASHIMA ,  Yusuke TAGAWA ,  Kazuma TAKAHARA ,  Shinji IMAI ,  Seiya KURATA

IPC: G06T7/73 ,  G06T7/11 ,  G06T7/50

Abstract: A camera that picks up an image of an object arranged in a real space and a controller are provided. The controller includes a setting unit that sets a target range in the real space, an obtaining unit that obtains a position and a posture of the camera, a determination unit that determines whether or not an object included in an image picked up by the camera is included in the target range based on the position and the posture of the camera, and an image processor that performs image processing on the image picked up by the camera, the image processing selected depending upon a result of determination by the determination unit.

公开(公告)号：US20210333182A1

公开(公告)日：2021-10-28

申请号：US17235945

申请日：2021-04-21

Applicant: SHIMADZU CORPORATION

Inventor： Takuro SATO ,  Tomotaka NAGASHIMA ,  Yukimitsu IWANAGA

IPC: G01N3/06 ,  G01N3/08

Abstract: Provided is a material testing machine that deforms a test piece and measures mechanical properties of a material of the test piece. The material testing machine includes: a first detection unit that detects a strain of the test piece by measuring a distance between reference points of the test piece; a second detection unit that detects a strain distribution of the test piece based on an image of a pattern formed on a surface of the test piece; and a display control unit that displays a detection result of the first detection unit and a detection result of the second detection unit on one screen.

公开(公告)号：US20230114484A1

公开(公告)日：2023-04-13

申请号：US17964884

申请日：2022-10-12

Applicant: SHIMADZU CORPORATION

Inventor： Tomotaka NAGASHIMA ,  Takahide HATAHORI ,  Hisanori MORITA ,  Kenji TAKUBO

IPC: G06T5/00 ,  G01N21/45 ,  G01N21/88 ,  G06T5/50

Abstract: An inspection system includes an image processing unit that suppresses noise of a complex number image on which pixels are represented by a complex number indicating a periodic change in a vibration state of an inspection target. The image processing unit acquires a degree of similarity between a pixel included in a target image region defined in the complex number image and a pixel included in a plurality of reference image regions defined in the complex number image separately from the target image region by comparing complex numbers representing pixels, and executes noise suppression processing of the target image region by using a weight based on the acquired degree of similarity.

公开(公告)号：US20230304787A1

公开(公告)日：2023-09-28

申请号：US18075419

申请日：2022-12-06

Applicant: SHIMADZU CORPORATION

Inventor： Tomotaka NAGASHIMA ,  Takahide HATAHORI ,  Kenji TAKUBO

IPC: G01B9/02 ,  G01H1/14

CPC classification number: G01B9/02095 ,  G01H1/14

Abstract: In a defect detection device (10), an exciter (11) gives a test object (S) a vibration with a variable frequency. A vibration state measurer (15, 163) performs a measurement of the vibration state of the surface of the test object by an optical means while the vibration is given to the test object, and determines, for each position on the surface, a numerical value representing the vibration state based on a result of the measurement. A judgment-index-value determiner (164) determines a judgment index value by Fourier transform based on the numerical value representing the vibration state at each position, where the judgment index value is a numerical value representing a strength of the vibration for each wavenumber. A wavenumber-wavelength determiner (165) determines, based on the judgment index value determined for each wavenumber, a wavenumber or wavelength of an elastic wave induced in the test object by the vibration.

公开(公告)号：US20240242500A1

公开(公告)日：2024-07-18

申请号：US18559084

申请日：2022-03-04

Applicant: SHIMADZU CORPORATION

Inventor： Ayako AKAZAWA ,  Tomotaka NAGASHIMA ,  Akie SOTOGUCHI

IPC: G06V20/40 ,  A61B5/00 ,  A61B5/11 ,  G06V10/24 ,  G06V40/10 ,  G06V40/20

CPC classification number: G06V20/41 ,  A61B5/1128 ,  A61B5/4561 ,  A61B5/4806 ,  A61B5/742 ,  G06V10/242 ,  G06V20/47 ,  G06V40/10 ,  G06V40/23 ,  G06V2201/03

Abstract: A sleeping video analysis method according to this invention includes a lying posture estimation step (step 311) of estimating a lying posture of a subject (200) while sleeping based on a sleeping video of a subject (200) while sleeping; a lying posture classification step (step 313) of classifying the lying posture based on a lying posture estimation result(s) of the lying posture estimation step (step 311); and a body movement measurement step (step 314) of measuring body movement based on the lying posture estimation result(s) of the lying posture estimation step (311). The sleeping video analysis method includes a display step of displaying at least one of a lying posture classification result(s) and a body movement measurement result(s).

公开(公告)号：US20210364276A1

公开(公告)日：2021-11-25

申请号：US17325212

申请日：2021-05-20

Applicant: SHIMADZU CORPORATION

Inventor： Tomotaka NAGASHIMA ,  Yukimitsu IWANAGA ,  Norio HIRAYAMA

IPC: G01B11/16

Abstract: A strain distribution measurement system includes a tensile tester that deforms a test piece to measure mechanical properties of a material of the test piece, and a strain distribution measuring device that measures a strain distribution of the test piece. The strain distribution measuring device measures the strain distribution of the test piece based on a distribution of at least one of a reflectance or a polarization characteristic on the main face of the test piece.