Systems and methods for taking X-ray images

    公开(公告)号:US11622740B2

    公开(公告)日:2023-04-11

    申请号:US17105627

    申请日:2020-11-26

    发明人: Jiali Tu Yongqin Xiao

    IPC分类号: A61B6/00 A61B6/04 A61B6/08

    摘要: The present disclosure relates to systems and methods for taking X-ray images. The method may include obtaining reference data associated with an object, the reference data including at least one of height data or historical data. The method may also include determining at least one of a start point or an end point of an imaging region associated with the object based on the reference data. The method may further include causing to take an X-ray image of the imaging region based on at least one of the start point or the end point.

    Systems and methods for controlling an X-ray imaging device

    公开(公告)号:US10925570B2

    公开(公告)日:2021-02-23

    申请号:US16023028

    申请日:2018-06-29

    IPC分类号: A61B6/00 G01N23/04

    摘要: A system includes one or more storage devices storing a set of instructions and at least one processor in communication with the storage device. When executing the instructions, the at least one processor is configured to cause the system to obtain a first operating state of an X-ray imaging device, and obtain a first input from a user via a terminal, the first input being associated with a second operating state of the X-ray imaging device. The at least one processor may further cause the system to determine whether the first input satisfies a switch condition. Upon a determination that the first input satisfies the switch condition, the at least one processor may further cause the system to transmit a first instruction to switch the X-ray imaging device from the first operating state to the second operating state.

    Systems and methods for controlling an X-ray imaging device

    公开(公告)号:US11707247B2

    公开(公告)日:2023-07-25

    申请号:US17180921

    申请日:2021-02-22

    IPC分类号: A61B6/00 G01N23/04

    摘要: A system includes one or more storage devices storing a set of instructions and at least one processor in communication with the storage device. When executing the instructions, the at least one processor is configured to cause the system to obtain a first operating state of an X-ray imaging device, and obtain a first input from a user via a terminal, the first input being associated with a second operating state of the X-ray imaging device. The at least one processor may further cause the system to determine whether the first input satisfies a switch condition. Upon a determination that the first input satisfies the switch condition, the at least one processor may further cause the system to transmit a first instruction to switch the X-ray imaging device from the first operating state to the second operating state.

    Systems and methods for determining examination parameters

    公开(公告)号:US11504083B2

    公开(公告)日:2022-11-22

    申请号:US17105643

    申请日:2020-11-27

    发明人: Wei Li Yongqin Xiao

    IPC分类号: A61B6/00 A61B6/04

    摘要: Systems and methods for determining one or more target examination parameters is provided. The methods may include obtaining target examination information of a subject and generating one or more initial examination parameters based on the target examination information. The methods may further include obtaining one or more historical examination parameters associated with the subject and updating at least one of the one or more initial examination parameters based on the one or more historical examination parameters to obtain one or more target examination parameters. The one or more target examination parameters may be used for performing a target examination on the subject.