ANALYSIS METHOD AND ANALYSIS APPARATUS
    1.
    发明公开

    公开(公告)号:US20230274441A1

    公开(公告)日:2023-08-31

    申请号:US18173312

    申请日:2023-02-23

    Abstract: An analysis apparatus includes a two-dimensional photographing unit 20, a three-dimensional photographing unit 30, and a computer 50 serving as an analysis unit. The two-dimensional photographing unit 20 two-dimensionally photographs a sample, to acquire a two-dimensional image D2. The three-dimensional photographing unit 30 three-dimensionally photographs the sample to acquire a three-dimensional image D3. The computer 50 analyzes the two-dimensional image D2 and outputs a two-dimensional analysis result R2, first. Subsequently, the computer 50 analyzes the three-dimensional image D3 and outputs a three-dimensional analysis result R3. At that time, the computer 50 analyzes the three-dimensional image D3 using an indicator included in the two-dimensional analysis result R2. This can improve the accuracy of the three-dimensional analysis result R3. Consequently, a more accurate analysis result of the sample can be acquired than that acquired in a case in which either two-dimensional photographing or three-dimensional photographing is performed solely.

Patent Agency Ranking