公开(公告)号：US20160365635A1

公开(公告)日：2016-12-15

申请号：US15179395

申请日：2016-06-10

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yo-Han JANG ,  Il-jong SONG ,  Young-Ki LEE ,  Young-Joo LEE ,  Hyeon-Hee CHOI

IPC: H01Q7/00 ,  H01Q1/24 ,  H01Q1/36 ,  H04B5/00 ,  H01Q1/50

CPC classification number: H01Q7/00 ,  H01Q1/243 ,  H01Q1/38 ,  H04B5/0031 ,  H04B5/0056 ,  H04B5/0081 ,  H04B5/0087

Abstract: A near field communication (NFC) antenna includes a first antenna electrode and a second antenna electrode, and a loop coil. The first and second antenna electrodes are formed on a first surface of a substrate. The loop coil is formed on the first surface of the substrate, is directly coupled between the first antenna electrode and the second antenna electrode, and includes a first plurality of turns. The first antenna electrode is located inside each of the plurality of turns of the loop coil, and the second antenna electrode is located outside each of the plurality of turns of the loop coil. An imaginary line passing through the first antenna electrode and the second antenna electrode is parallel to one of edges of the substrate. Each of the first plurality of turns of the loop coil does not overlap each other.

Abstract translation: 近场通信（NFC）天线包括第一天线电极和第二天线电极以及环形线圈。 第一和第二天线电极形成在基板的第一表面上。 环形线圈形成在基板的第一表面上，直接耦合在第一天线电极和第二天线电极之间，并且包括第一多个匝数。 第一天线电极位于环形线圈的多个匝中的每一个内，并且第二天线电极位于环形线圈的多个匝数的外侧。 穿过第一天线电极和第二天线电极的假想线平行于衬底的一个边缘。 环形线圈的第一多圈中的每一个不彼此重叠。

公开(公告)号：US20170328771A1

公开(公告)日：2017-11-16

申请号：US15402751

申请日：2017-01-10

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Tae-Yong JO ,  Young-Joo LEE ,  Chang-Hoon CHOI ,  Jong-Jeong KIM

IPC: G01J3/02

CPC classification number: G01J3/0297 ,  G01J3/28

Abstract: A method of calibrating a measuring apparatus includes determining apparatus parameters that have an influence on a measurement spectrum generated by the measuring apparatus, generating the measurement spectrum by exposing a measurement target on a sample to light generated by the measuring apparatus, calculating an error of the apparatus parameters by comparing the measurement spectrum to an ideal spectrum corresponding to the apparatus parameters, and calibrating the measuring apparatus based on the calculated error of the apparatus parameters.