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公开(公告)号:US20210201964A1
公开(公告)日:2021-07-01
申请号:US17182357
申请日:2021-02-23
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: EUN-JI KIM , JUNG-JUNE PARK , JEONG-DON IHM , BYUNG-HOON JEONG , YOUNG-DON CHOI
IPC: G11C7/10
Abstract: A memory device includes; a first memory chip including a first on-die Termination (ODT) circuit comprising a first ODT resistor, a second memory chip including a second ODT circuit comprising a second ODT resistor, at least one chip enable signal pin that receives at least one chip enable signal, wherein the at least one chip enable signal selectively enables at least one of the first memory chip and the second memory chip, and an ODT pin commonly connected to the first memory chip and the second memory chip that receives an ODT signal, wherein the ODT signal defines an enable period for at least one of the first ODT circuit and the second ODT circuit, and in response to the ODT signal and the at least one chip enable signal, one of the first ODT resistor and the second ODT resistor is enabled to terminate a signal received by at least one of the first memory chip and the second memory chip.
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2.
公开(公告)号:US20240021259A1
公开(公告)日:2024-01-18
申请号:US18361132
申请日:2023-07-28
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: EUN-JI KIM , JUNG-JUNE PARK , JEONG-DON IHM , BYUNG-HOON JEONG , YOUNG-DON CHOI
CPC classification number: G11C29/025 , G11C29/028 , G11C5/063 , G11C7/1048 , G11C7/1084 , G11C29/022 , G11C7/1057 , G11C16/26 , G11C16/102 , G11C16/06
Abstract: A nonvolatile memory (NVM) device includes a data pin, a control pin, an on-die termination (ODT) pin, and a plurality of NVM memory chips commonly connected to the data pin and the control pin. A first NVM chip among the NVM chips includes an ODT circuit. The first NVM chip determines one of an ODT write mode and an ODT read mode based on a control signal received through the control pin and an ODT signal received through the ODT pin, uses the ODT circuit to perform an ODT on the data pin during the ODT write mode, and uses the ODT circuit to perform the ODT on the control pin during the ODT read mode.
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公开(公告)号:US20190139585A1
公开(公告)日:2019-05-09
申请号:US16058709
申请日:2018-08-08
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: EUN-JI KIM , JUNG-JUNE PARK , JEONG-DON IHM , BYUNG-HOON JEONG , YOUNG-DON CHOI
IPC: G11C7/10
Abstract: A memory device includes; a first memory chip including a first on-die Termination (ODT) circuit comprising a first ODT resistor, a second memory chip including a second ODT circuit comprising a second ODT resistor, at least one chip enable signal pin that receives at least one chip enable signal, wherein the at least one chip enable signal selectively enables at least one of the first memory chip and the second memory chip, and an ODT pin commonly connected to the first memory chip and the second memory chip that receives an ODT signal, wherein the ODT signal defines an enable period for at least one of the first ODT circuit and the second ODT circuit, and in response to the ODT signal and the at least one chip enable signal, one of the first ODT resistor and the second ODT resistor is enabled to terminate a signal received by at least one of the first memory chip and the second memory chip.
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公开(公告)号:US20230298639A1
公开(公告)日:2023-09-21
申请号:US18201853
申请日:2023-05-25
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: EUN-JI KIM , JUNG-JUNE PARK , JEONG-DON IHM , BYUNG-HOON JEONG , YOUNG-DON CHOI
IPC: G11C7/10
CPC classification number: G11C7/1048 , G11C7/1084 , G11C7/1057 , G11C2207/105
Abstract: A memory device includes; a first memory chip including a first on-die Termination (ODT) circuit comprising a first ODT resistor, a second memory chip including a second ODT circuit comprising a second ODT resistor, at least one chip enable signal pin that receives at least one chip enable signal, wherein the at least one chip enable signal selectively enables at least one of the first memory chip and the second memory chip, and an ODT pin commonly connected to the first memory chip and the second memory chip that receives an ODT signal, wherein the ODT signal defines an enable period for at least one of the first ODT circuit and the second ODT circuit, and in response to the ODT signal and the at least one chip enable signal, one of the first ODT resistor and the second ODT resistor is enabled to terminate a signal received by at least one of the first memory chip and the second memory chip.
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公开(公告)号:US20240371457A1
公开(公告)日:2024-11-07
申请号:US18776432
申请日:2024-07-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: EUN-JI KIM , JUNG-JUNE PARK , JEONG-DON IHM , BYUNG-HOON JEONG , YOUNG-DON CHOI
Abstract: A nonvolatile memory (NVM) device includes a data pin, a control pin, an on-die termination (ODT) pin, and a plurality of NVM memory chips commonly connected to the data pin and the control pin. A first NVM chip among the NVM chips includes an ODT circuit. The first NVM chip determines one of an ODT write mode and an ODT read mode based on a control signal received through the control pin and an ODT signal received through the ODT pin, uses the ODT circuit to perform an ODT on the data pin during the ODT write mode, and uses the ODT circuit to perform the ODT on the control pin during the ODT read mode.
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公开(公告)号:US20220215892A1
公开(公告)日:2022-07-07
申请号:US17704345
申请日:2022-03-25
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Eun-ji KIM , JUNG-JUNE PARK , JEONG-DON IHM , BYUNG-HOON JEONG , YOUNG-DON CHOI
Abstract: A nonvolatile memory (NVM) device includes a data pin, a control pin, an on-die termination (ODT) pin, and a plurality of NVM memory chips commonly connected to the data pin and the control pin. A first NVM chip among the NVM chips includes an ODT circuit. The first NVM chip determines one of an ODT write mode and an ODT read mode based on a control signal received through the control pin and an ODT signal received through the ODT pin, uses the ODT circuit to perform an ODT on the data pin during the ODT write mode, and uses the ODT circuit to perform the ODT on the control pin during the ODT read mode.
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公开(公告)号:US20210151117A1
公开(公告)日:2021-05-20
申请号:US17161995
申请日:2021-01-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: EUN-JI KIM , JUNG-JUNE PARK , JEONG-DON IHM , BYUNG-HOON JEONG , YOUNG-DON CHOI
Abstract: A nonvolatile memory (NVM) device includes a data pin, a control pin, an on-die termination (ODT) pin, and a plurality of NVM memory chips commonly connected to the data pin and the control pin. A first NVM chip among the NVM chips includes an ODT circuit. The first NVM chip determines one of an ODT write mode and an ODT read mode based on a control signal received through the control pin and an ODT signal received through the ODT pin, uses the ODT circuit to perform an ODT on the data pin during the ODT write mode, and uses the ODT circuit to perform the ODT on the control pin during the ODT read mode.
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公开(公告)号:US20200279591A1
公开(公告)日:2020-09-03
申请号:US16875163
申请日:2020-05-15
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: EUN-JI KIM , JUNG-JUNE PARK , JEONG-DON IHM , BYUNG-HOON JEONG , YOUNG-DON CHOI
IPC: G11C7/10
Abstract: A memory device includes; a first memory chip including a first on-die Termination (ODT) circuit comprising a first ODT resistor, a second memory chip including a second ODT circuit comprising a second ODT resistor, at least one chip enable signal pin that receives at least one chip enable signal, wherein the at least one chip enable signal selectively enables at least one of the first memory chip and the second memory chip, and an ODT pin commonly connected to the first memory chip and the second memory chip that receives an ODT signal, wherein the ODT signal defines an enable period for at least one of the first ODT circuit and the second ODT circuit, and in response to the ODT signal and the at least one chip enable signal, one of the first ODT resistor and the second ODT resistor is enabled to terminate a signal received by at least one of the first memory chip and the second memory chip.
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9.
公开(公告)号:US20200258589A1
公开(公告)日:2020-08-13
申请号:US16862624
申请日:2020-04-30
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: EUN-JI KIM , JUNG-JUNE PARK , JEONG-DON IHM , BYUNG-HOON JEONG , YOUNG-DON CHOI
Abstract: A nonvolatile memory (NVM) device includes a data pin, a control pin, an on-die termination (ODT) pin, and a plurality of NVM memory chips commonly connected to the data pin and the control pin. A first NVM chip among the NVM chips includes an ODT circuit. The first NVM chip determines one of an ODT write mode and an ODT read mode based on a control signal received through the control pin and an ODT signal received through the ODT pin, uses the ODT circuit to perform an ODT on the data pin during the ODT write mode, and uses the ODT circuit to perform the ODT on the control pin during the ODT read mode.
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10.
公开(公告)号:US20190325979A1
公开(公告)日:2019-10-24
申请号:US16458933
申请日:2019-07-01
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: EUN-JI KIM , JUNG-JUNE PARK , JEONG-DON IHM , BYUNG-HOON JEONG , YOUNG-DON CHOI
Abstract: A nonvolatile memory (NVM) device includes a data pin, a control pin, an on-die termination (ODT) pin, and a plurality of NVM memory chips commonly connected to the data pin and the control pin. A first NVM chip among the NVM chips includes an ODT circuit. The first NVM chip determines one of an ODT write mode and an ODT read mode based on a control signal received through the control pin and an ODT signal received through the ODT pin, uses the ODT circuit to perform an ODT on the data pin during the ODT write mode, and uses the ODT circuit to perform the ODT on the control pin during the ODT read mode.
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