公开(公告)号：US20140048591A1

公开(公告)日：2014-02-20

申请号：US13949674

申请日：2013-07-24

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Ki Ju LEE ,  Suk Yong LEE ,  Young Goun LEE

IPC: G01N35/00

CPC classification number: G01N35/00 ,  G01N35/00069 ,  G01N35/00693

Abstract: A test platform is provided for testing a detection module of a test apparatus to determine whether correction is needed or for quality control of the test apparatus. The test platform includes a body, and at least one reference material which is formed on the body and on which at least one color is printed.

Abstract translation: 提供测试平台用于测试测试装置的检测模块以确定是否需要校正或者用于测试装置的质量控制。 测试平台包括主体和形成在主体上并且至少一种颜色被印刷在其上的至少一个参考材料。