公开(公告)号：US20240129453A1

公开(公告)日：2024-04-18

申请号：US18462384

申请日：2023-09-06

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： SANGWOO LEE ,  Dongoh KIM ,  MINHYUK LEE ,  SONGSU KIM

IPC: H04N17/00 ,  H04N17/02 ,  H04N23/56

CPC classification number: H04N17/002 ,  H04N17/02 ,  H04N23/56

Abstract: Disclosed is a test system which includes a light source device. The light source device includes a first light source configured to radiate a first light, a plurality of neutral-density (ND) filters including a first ND filter attached to the first light source and configured to adjust the first light, an aperture unit including a plurality of apertures configured to adjust the first light received from the first ND filter and a diffuser configured to diffuse the first light received from the aperture unit and to radiate the first light for testing an image sensor, wherein an illuminance of the first light is adjusted based on a transmittance of the first ND filter and an aperture ratio of each of the apertures.