公开(公告)号：US11968903B2

公开(公告)日：2024-04-23

申请号：US16957829

申请日：2018-12-18

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jisun Kim ,  Taeyoung Kim ,  Joungkook Seo ,  Sanghoon Choi

IPC: H10N30/50 ,  H04R3/12 ,  H04R17/00 ,  H10N30/05 ,  H10N30/082 ,  H10N30/853 ,  H10N30/87

CPC classification number: H10N30/50 ,  H04R3/12 ,  H04R17/00 ,  H10N30/05 ,  H10N30/082 ,  H10N30/853 ,  H10N30/872

Abstract: Provided are a piezoelectric element for a speaker and a method of manufacturing the same. The piezoelectric element for a speaker includes a plurality of piezoelectric ceramic layers stacked on one another in a thickness direction, and a plurality of electrodes provided to be connected to middle portions of sides of the plurality of piezoelectric ceramic layers along external walls of the plurality of stacked piezoelectric ceramic layers, wherein middle portions of some sides from among a plurality of sides of each of the plurality of piezoelectric ceramic layers are etched, and wherein the plurality of piezoelectric ceramic layers are stacked on one another in the thickness direction not to overlap non-etched sides from among the plurality of sides.

公开(公告)号：US20250045909A1

公开(公告)日：2025-02-06

申请号：US18435692

申请日：2024-02-07

Applicant: SAMSUNG ELECTRONICS CO.,LTD.

Inventor： Junyeob KIM ,  Jiyun JUNG ,  Jisun Kim

IPC: G06T7/00 ,  G06T7/70

Abstract: An overlay measurement device includes a light source configured to direct an illumination to an overlay measurement target, a lens assembly configured to condense the illumination at a measurement position at any one point on the overlay measurement target, a detector configured to obtain a plurality of target overlay images through a beam reflected from the measurement position, a controller configured to determine at least one of a first similarity coefficient and a second similarity coefficient for each of the plurality of target overlay images and determine a defective overlay image from among the plurality of target overlay images based on at least one of the first similarity coefficient and the second similarity coefficient for each of the plurality of target overlay images, and a memory configured to store a normal overlay image and defect data corresponding to the defective overlay image.