公开(公告)号：US11540785B2

公开(公告)日：2023-01-03

申请号：US16751319

申请日：2020-01-24

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jaemock Yl ,  Chaeyeong Lee

IPC: A61B6/00 ,  A61B6/02 ,  G06T7/00 ,  G06T11/00

Abstract: An X-ray image processing method, including obtaining a first X-ray image of an object including a plurality of materials including a first material and a second material; obtaining a first partial image generated by imaging the first material and a second partial image generated by imaging the first material overlapping the second material from the first X-ray image; obtaining first information related to a stereoscopic structure of the first material, based on the first partial image included in the first X-ray image; and obtaining second information about the second material based on the first information and the second partial image.