公开(公告)号：US20240201673A1

公开(公告)日：2024-06-20

申请号：US18330589

申请日：2023-06-07

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Keunseo KIM ,  Gyungmin KIM ,  Sangdo PARK

IPC: G05B19/418 ,  G06T7/00 ,  H01L21/66

CPC classification number: G05B19/41875 ,  G06T7/001 ,  H01L22/12 ,  G05B2219/2602 ,  G06T2207/20081 ,  G06T2207/20084

Abstract: A processor-implemented method of an apparatus or system includes obtaining an expert classification criterion from a memory of the apparatus or system; converting manufacturing process data associated with a manufacturing process to a test sample in a form of an image; generating, using a machine learning model provided the test sample, a probability value that the test sample corresponds to a target class representing an anomaly occurring in the manufacturing process; adjusting the probability value by reflecting the expert classification criterion for the anomaly; and identifying, by classifying the anomaly based on the adjusted probability value, whether a final abnormality in the manufacturing process has occurred.

公开(公告)号：US20210182670A1

公开(公告)日：2021-06-17

申请号：US16893656

申请日：2020-06-05

Applicant: Samsung Electronics Co., Ltd.

Inventor： Gyungmin KIM

IPC: G06N3/08 ,  G06N3/04

Abstract: A processor-implemented method of verifying the training of a neural network between frameworks is provided. The method includes providing test data to a first module operating based on a first framework, and providing the test data to a second module operating based on a second framework. The method further includes obtaining, from the first module, first data generated in the first module, obtaining, from the second module, second data generated in the second module, and comparing the first data with the second data.