公开(公告)号：US09874498B2

公开(公告)日：2018-01-23

申请号：US14824129

申请日：2015-08-12

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Im-ho Shin ,  Eun-jeong Jang ,  Chung-ung Kim

IPC: G06F19/00 ,  G01N1/28 ,  G01N35/00 ,  B01L3/00

CPC classification number: G01N1/28 ,  B01L3/545 ,  G01N35/00069 ,  G01N35/00663 ,  G01N35/00732 ,  G01N2035/00108 ,  G01N2035/00752 ,  G01N2035/00772 ,  G01N2035/00782 ,  G01N2035/00831 ,  G01N2035/0091

Abstract: An in-vitro diagnostic apparatus includes a loading unit which receives a test medium including a test object; a first clock including first time information that is set as a standard clock time and used to determine whether an expiration date of the test medium has passed; a second clock including second time information that can be set as an arbitrary time; a sensor which acquires the expiration date of the test medium; a controller which determines whether the expiration date of the test medium has passed, based on the first time information; and an analyzer which analyzes the test object based on the second time information when it is determined that the expiration date of the test medium has not yet passed.