公开(公告)号：US20220179724A1

公开(公告)日：2022-06-09

申请号：US17376441

申请日：2021-07-15

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Young-Seop SHIM ,  Kyung Duk LEE ,  Jong-Sung NA ,  Chan Moo PARK ,  In Kap CHANG ,  Chang Min CHO

IPC: G06F11/00 ,  G06F17/18 ,  G06N20/00

Abstract: A method for operating a storage device capable of improving reliability of a memory system is provided. The method includes providing a storage device which includes a first component and a second component; receiving, via a host interface of the storage device, a command for requesting failure possibility information about the storage device from an external device; and providing, via the host interface, the failure possibility information about the storage device to the external device in response to the command.