公开(公告)号：US20200251658A1

公开(公告)日：2020-08-06

申请号：US16589330

申请日：2019-10-01

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： DA IL EOM ,  KEEWON KIM ,  BYEONGTAEK BAE ,  MINKYUNG LEE

IPC: H01L51/00 ,  H01L27/30 ,  H01L51/42

Abstract: A method of measuring an image sensor is disclosed. The method includes connecting a measurement unit to an image sensor, producing an electric current, which sequentially flows through a second connection line, second lower electrodes, an upper electrode, first lower electrodes, and a first connection line of the image sensor, using the measurement unit, and measuring an alignment state of the lower electrodes, the photoelectric conversion layer, and the upper electrode.