-
公开(公告)号：US10768215B2
公开(公告)日：2020-09-08
申请号：US16153550
申请日：2018-10-05
IPC分类号： G01R29/06
摘要： A method of measuring the AM/PM conversion of a device under test having a local oscillator is described. A device under test with an embedded local oscillator is provided. A signal source is connected to an input of the device under test. A receiver is connected to an output of the device under test. An input signal is provided by the signal source. The input signal has an initial power level. The input signal is input to the device under test. The power level of the input signal is changed. An output signal of the device under test is measured at different power levels of the input signal.
-
公开(公告)号：US10454600B2
公开(公告)日：2019-10-22
申请号：US15487102
申请日：2017-04-13
发明人： Martin Leibfritz , Werner Held
IPC分类号： H04B3/46 , H04B17/364 , H04L27/02 , H04L27/00 , G01R27/28
摘要： A method for measuring group delay on a device under test is described, wherein a test signal with a carrier frequency is generated. An amplitude modulation is applied to said test signal in order to generate at least two group delay signals having frequencies that are symmetrical to the frequency of said test signal. At least said group delay signals are provided to said device under test. Further, a measurement device and a measurement system are described.
-
公开(公告)号：US10353917B2
公开(公告)日：2019-07-16
申请号：US15443035
申请日：2017-02-27
IPC分类号： G06F16/25 , H04L29/06 , H04B3/46 , G01R31/317 , H04B17/23 , H04B17/26 , H04B17/309 , H04B17/00
摘要： A measurement device comprising a measurement unit adapted to measure a transmission characteristic for providing an eye pattern; and a conversion unit adapted to convert automatically the eye pattern into a character separated values, CSV, file.
-
公开(公告)号：US20180252791A1
公开(公告)日：2018-09-06
申请号：US15449668
申请日：2017-03-03
发明人： Martin Leibfritz , Werner Held
CPC分类号： G01R35/005 , G01R27/32
摘要： A test device for testing an electronic device under test comprises a remote measurement module configured to capture signals originating from the electronic device under test and output the captured signals, and an analysis device configured to receive the captured signals and to calibrate the test device based on test signals provided by the analysis device and the captured signals.
-
公开(公告)号：US20180048535A1
公开(公告)日：2018-02-15
申请号：US15232973
申请日：2016-08-10
发明人： Martin Leibfritz , Mike Leffel
IPC分类号： H04L12/24
CPC分类号： H04L41/24 , G01R27/28 , G01R35/005 , H04L43/50
摘要： A network analyzer system includes a network analyzer having at least two ports, a first operational device connected a first port of the at least two ports of the network analyzer and configured to perform a first task with the network analyzer, and a second operational device connected a second port of the at least two ports of the network analyzer and configured to perform a second task with the network analyzer. The second task is performed at least partially concurrently with the first task.
-
公开(公告)号：US10345421B2
公开(公告)日：2019-07-09
申请号：US15445705
申请日：2017-02-28
发明人： Martin Leibfritz
IPC分类号： G01R35/00 , G06K7/14 , G06K19/06 , G01R27/28 , G06F3/044 , G01R31/319 , G01R13/02 , G01R27/04 , G01R27/32
摘要： A measurement accessory device connectable to a measurement apparatus or to a device under test wherein the measurement accessory device comprises means for providing characteristic data of said measurement accessory device in machine readable form used by said measurement apparatus during measurement of said device under test.
-
公开(公告)号：US09903932B2
公开(公告)日：2018-02-27
申请号：US14961788
申请日：2015-12-07
发明人： Martin Leibfritz
IPC分类号： G01R35/00 , G01R27/28 , G01R31/319 , G01R27/00
CPC分类号： G01R35/005 , G01R27/00 , G01R27/28 , G01R31/3191 , G01R35/00
摘要： A calibration apparatus, for calibration of a measurement device, is provided. The calibration apparatus includes a calibration device configured to calibrate the measurement device. The calibration device also includes a verificationH device configured to verify the calibration of the measurement device. The calibration device also includes a switch configured to switch between a connection of the measurement device to the calibration device and a connection of the measurement device to the verification device.
-
公开(公告)号：US20170315206A1
公开(公告)日：2017-11-02
申请号：US15445705
申请日：2017-02-28
发明人： Martin Leibfritz
CPC分类号： G01R35/005 , G01R13/02 , G01R27/04 , G01R27/28 , G01R27/32 , G01R31/3191 , G01R35/007 , G06F3/044 , G06K7/1404 , G06K19/06009
摘要： A measurement accessory device connectable to a measurement apparatus or to a device under test wherein the measurement accessory device comprises means for providing characteristic data of said measurement accessory device in machine readable form used by said measurement apparatus during measurement of said device under test.
-
公开(公告)号：US20170160321A1
公开(公告)日：2017-06-08
申请号：US15299947
申请日：2016-10-21
发明人： Werner Held , Martin Leibfritz , Marcel Ruf
IPC分类号： G01R23/163 , G01R27/06 , G01R15/12
CPC分类号： G01R23/163 , G01R15/12 , G01R27/06 , G01R31/2601
摘要： A measurement apparatus (1) comprising a high frequency measurement unit (2) adapted to measure high frequency parameters (HFP) of a device under test (DUT) connected to ports of said measurement apparatus (1) and a multimeter unit (3) adapted to measure DC characteristics parameters (DCP) of said device under test (DUT) connected via control signal lines (CL) to a control bus interface (6) of said measurement apparatus (1).
-
公开(公告)号：US20150130554A1
公开(公告)日：2015-05-14
申请号：US14398418
申请日：2013-05-03
发明人： Michael Sterns , Martin Leibfritz
摘要： A measuring bridge (1) provides a first matching pad (2), a second matching pad (3) and a third matching pad (4), wherein all matching pads (2, 3, 4) comprise at least three resistors (21, 22, 23, 31, 32, 33, 41, 42, 43) which are arranged in a T-structure. A second resistor (32) of the second matching pad (3) is connected to a second resistor (22) of the first matching pad (2), and a third resistor (43) of the third matching pad (4) is connected to a third resistor (23) of the first matching pad (2). A second resistor (42) of the third matching pad (4) can be connected to a device under test (7). A third resistor (33) of the second matching pad (3) can be connected to a calibration standard (5), and a first resistor (31, 41) of the second and the third matching pad (3, 4) are connected in each case to a signal input of an element (11) which suppresses a common-mode component on its two signal inputs.
摘要翻译： 测量桥（1）提供第一匹配焊盘（2），第二匹配焊盘（3）和第三匹配焊盘（4），其中所有匹配焊盘（2,3,4）包括至少三个电阻器（21， 22,23,31,32,33,41,42,43），其被布置成T形结构。 第二匹配焊盘（3）的第二电阻器（32）连接到第一匹配焊盘（2）的第二电阻器（22），并且第三匹配焊盘（4）的第三电阻器（43）连接到 第一匹配焊盘（2）的第三电阻器（23）。 第三匹配焊盘（4）的第二电阻（42）可连接到被测器件（7）。 第二匹配焊盘（3）的第三电阻器（33）可以连接到校准标准（5），并且第二和第三匹配焊盘（3,4）的第一电阻器（31,41）被连接到 每个情况都适用于抑制其两个信号输入上的共模分量的元件（11）的信号输入。
-
-
-
-
-
-
-
-
-
搜索结果
26 条记录 (耗时 0.019 秒)
