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    WAVE GENERATION BY WAVE PROPAGATION PHASE-SHIFT COMPENSATION IN AN NON-LINEAR OPTICAL MEDIUM
    1.
    发明申请
    WAVE GENERATION BY WAVE PROPAGATION PHASE-SHIFT COMPENSATION IN AN NON-LINEAR OPTICAL MEDIUM 有权
    在非线性光学介质中通过波形传播相位移位补偿的波形生成

    公开(公告)号：US20060238854A1

    公开(公告)日：2006-10-26

    申请号：US11379876

    申请日：2006-04-24

    Applicant: Riad Haidar ,  Emmanuel Rosencher ,  Jerome Primot

    Inventor： Riad Haidar ,  Emmanuel Rosencher ,  Jerome Primot

    IPC: G02F2/02

    CPC classification number: G02F1/3534 ,  G02F2001/3548

    Abstract: In a nonlinear optical medium such as the gallium arsenide, two collinear incident monochromatic waves are injected to generate a monochromatic wave. The medium induces between the three waves a propagation phase-shift that has a value π if the three waves travel a coherence length in the medium and that is compensated at the value 0 modulo 2π each time that the three waves have travelled a periodic distance in the medium. In order to significantly increase the conversion efficiency, the periodic distance between two successive bounces of total internal reflection of the waves in zig-zag is strictly less than the coherence length. The high conversion efficiency on a very short material length leads to product high-power coherent optical sources particularly with wavelengths of approximately 10 μm.

    Abstract translation: 在诸如砷化镓的非线性光学介质中，注入两个共线入射单色波以产生单色波。 如果三个波行进介质中的相干长度，并且每当三个波已经行进了周期性距离时以0pi的值2pi补偿，则介质在三个波之间引起传播相移，其具有值pi 介质。 为了显着提高转换效率，在之字形中波的全内反射两次连续反弹之间的周期距离严格小于相干长度。 在非常短的材料长度上的高转换效率导致产品大功率相干光源，特别是具有大约10um的波长。

    METHOD, PHASE GRATING AND DEVICE FOR ANALYZING A WAVE SURFACE OF A LIGHT BEAM
    4.
    发明申请
    METHOD, PHASE GRATING AND DEVICE FOR ANALYZING A WAVE SURFACE OF A LIGHT BEAM 有权
    方法，用于分析光束波形表面的相位蚀刻和器件

    公开(公告)号：US20090262364A1

    公开(公告)日：2009-10-22

    申请号：US12426994

    申请日：2009-04-21

    Applicant: Jerome Primot ,  Bruno Toulon ,  Nicolas Guerineau ,  Sabrina Velghe ,  Riad Haidar

    Inventor： Jerome Primot ,  Bruno Toulon ,  Nicolas Guerineau ,  Sabrina Velghe ,  Riad Haidar

    IPC: G01B9/02

    CPC classification number: G01J9/0215

    Abstract: The application relates to a method for analyzing the wave surface of a light beam from a source to the focus of a lens. The beam illuminates a sample on the analysis plane and having a defect. A diffraction grating of the plane is a conjugate of an analysis plane through a focal system. An image is formed in a plane at a distance from the grating plane and analyzed by processing means. The invention encodes this grating by a phase function resulting from the multiplication of two phase functions, a first exclusion function defining a meshing of useful zones transmitting the beam to be analyzed in the form of light pencil beams, and a second phase fundamental function which creates a phase opposition between two light pencil beams coming out of adjacent meshes of the exclusion grating.

    Abstract translation: 本申请涉及一种用于分析从光源到透镜的焦点的光束的波面的方法。 光束照射分析平面上的样品并具有缺陷。 平面的衍射光栅是通过焦点系统的分析平面的共轭。 在与光栅平面一定距离的平面中形成图像，并通过处理装置进行分析。 本发明通过由两相功能的乘法产生的相位函数对该光栅进行编码，第一排除函数定义了以光笔形式的光束传输要分析的光束的有用区域的啮合，以及第二相位基函数，其形成 两个光束笔之间的相位相对离开了排除光栅的相邻网格。

    MICROBOLOMETER ARRAY WITH IMPROVED PERFORMANCE
    5.
    发明申请
    MICROBOLOMETER ARRAY WITH IMPROVED PERFORMANCE 有权
    具有改进性能的MICROBOLOMETER ARRAY

    公开(公告)号：US20140226021A1

    公开(公告)日：2014-08-14

    申请号：US14131298

    申请日：2012-07-13

    Applicant: Charlie Koechlin ,  Patrick Bouchon ,  Riad Haidar ,  Jean-Luc Pelouard ,  Jean-Jacques Yon ,  Joël Deschamps ,  Fabrice Pardo ,  Stéphane Collin

    Inventor： Charlie Koechlin ,  Patrick Bouchon ,  Riad Haidar ,  Jean-Luc Pelouard ,  Jean-Jacques Yon ,  Joël Deschamps ,  Fabrice Pardo ,  Stéphane Collin

    IPC: G01J5/20 ,  H04N5/33 ,  H01L27/146

    CPC classification number: G01J5/20 ,  G01J5/08 ,  G01J5/0853 ,  G01J2005/204 ,  H01L27/14685 ,  H04N5/33

    Abstract: According to one aspect, the invention relates to a microbolometer array for thermal detection of light radiation in a given spectral band, comprising a supporting substrate and an array of microbolometers (300) of given dimensions, arranged in an array. Each of said microbolometers comprises a membrane (301) suspended above said supporting substrate, said membrane consisting of an element (305) for absorbing the incident radiation and a thermometric element (304) in thermal contact with the absorber, electrically insulated from said absorber element. The absorber element comprises at least one first metal/insulator/metal (MIM) structure comprising a multilayer of three superposed films of submicron-order thickness i.e. a first metallic film (311), a dielectric film (310), and a second metallic film (309), said MIM structure being able to have a resonant absorption of said incident radiation at at least one wavelength in said spectral band. The area of the microbolometer pixel covered by said membrane (301) is less than or equal to half of the total area of the microbolometer pixel.

    Abstract translation: 根据一个方面，本发明涉及一种用于在给定光谱带中的热辐射的热检测的微热辐射计阵列，其包括支撑衬底和以阵列布置的给定尺寸的微热计（300）阵列。 每个所述微伏热计包括悬挂在所述支撑基底上方的膜（301），所述膜由用于吸收入射辐射的元件（305）和与所述吸收体热接触的测温元件（304）组成，所述温度测量元件 。 所述吸收元件包括至少一个第一金属/绝缘体/金属（MIM）结构，其包括具有亚微米级厚度的三层重叠膜的多层，即第一金属膜（311），电介质膜（310）和第二金属膜 （309），所述MIM结构能够在所述光谱带中具有至少一个波长的所述入射辐射的共振吸收。 由所述膜（301）覆盖的微热辐射计像素的面积小于或等于微测热计像素的总面积的一半。

    Microbolometer array with improved performance
    6.
    发明授权
    Microbolometer array with improved performance 有权
    Microbolometer阵列具有改进的性能

    公开(公告)号：US09417134B2

    公开(公告)日：2016-08-16

    申请号：US14131298

    申请日：2012-07-13

    Applicant: Charlie Koechlin ,  Patrick Bouchon ,  Riad Haidar ,  Jean-Luc Pelouard ,  Jean-Jacques Yon ,  Joël Deschamps ,  Fabrice Pardo ,  Stéphane Collin

    Inventor： Charlie Koechlin ,  Patrick Bouchon ,  Riad Haidar ,  Jean-Luc Pelouard ,  Jean-Jacques Yon ,  Joël Deschamps ,  Fabrice Pardo ,  Stéphane Collin

    IPC: H04N5/33 ,  G01J5/20 ,  G01J5/08 ,  H01L27/146

    CPC classification number: G01J5/20 ,  G01J5/08 ,  G01J5/0853 ,  G01J2005/204 ,  H01L27/14685 ,  H04N5/33

    Abstract: According to one aspect, the invention relates to a microbolometer array for thermal detection of light radiation in a given spectral band, comprising a supporting substrate and an array of microbolometers (300) of given dimensions, arranged in an array. Each of said microbolometers comprises a membrane (301) suspended above said supporting substrate, said membrane consisting of an element (305) for absorbing the incident radiation and a thermometric element (304) in thermal contact with the absorber, electrically insulated from said absorber element. The absorber element comprises at least one first metal/insulator/metal (MIM) structure comprising a multilayer of three superposed films of submicron-order thickness i.e. a first metallic film (311), a dielectric film (310), and a second metallic film (309), said MIM structure being able to have a resonant absorption of said incident radiation at at least one wavelength in said spectral band. The area of the microbolometer pixel covered by said membrane (301) is less than or equal to half of the total area of the microbolometer pixel.

    Abstract translation: 根据一个方面，本发明涉及一种用于在给定光谱带中的热辐射的热检测的微热辐射计阵列，其包括支撑衬底和以阵列布置的给定尺寸的微热计（300）阵列。 每个所述微伏热计包括悬挂在所述支撑基底上方的膜（301），所述膜由用于吸收入射辐射的元件（305）和与所述吸收体热接触的测温元件（304）组成，所述温度测量元件 。 所述吸收元件包括至少一个第一金属/绝缘体/金属（MIM）结构，其包括具有亚微米级厚度的三层重叠膜的多层，即第一金属膜（311），电介质膜（310）和第二金属膜 （309），所述MIM结构能够在所述光谱带中具有至少一个波长的所述入射辐射的共振吸收。 由所述膜（301）覆盖的微热辐射计像素的面积小于或等于微测热计像素的总面积的一半。

    Method, phase grating and device for analyzing a wave surface of a light beam
    8.
    发明授权
    Method, phase grating and device for analyzing a wave surface of a light beam 有权
    方法，相位光栅和用于分析光束波面的装置

    公开(公告)号：US08654348B2

    公开(公告)日：2014-02-18

    申请号：US12426994

    申请日：2009-04-21

    Applicant: Jérôme Primot ,  Bruno Toulon ,  Nicolas Guérineau ,  Sabrina Velghe ,  Riad Haidar

    Inventor： Jérôme Primot ,  Bruno Toulon ,  Nicolas Guérineau ,  Sabrina Velghe ,  Riad Haidar

    IPC: G01B9/02

    CPC classification number: G01J9/0215

    Abstract: The application relates to a method for analyzing the wave surface of a light beam from a source to the focus of a lens. The beam illuminates a sample on the analysis plane and having a defect. A diffraction grating of the plane is a conjugate of an analysis plane through a focal system. An image is formed in a plane at a distance from the grating plane and analyzed by processing means. The invention encodes this grating by a phase function resulting from the multiplication of two phase functions, a first exclusion function defining a meshing of useful zones transmitting the beam to be analyzed in the form of light pencil beams, and a second phase fundamental function which creates a phase opposition between two light pencil beams coming out of adjacent meshes of the exclusion grating.

    Abstract translation: 本申请涉及一种用于分析从光源到透镜的焦点的光束的波面的方法。 光束照射分析平面上的样品并具有缺陷。 平面的衍射光栅是通过焦点系统的分析平面的共轭。 在与光栅平面一定距离的平面中形成图像，并通过处理装置进行分析。 本发明通过由两相功能的乘法产生的相位函数对该光栅进行编码，第一排除函数定义了以光笔形式的光束传输要分析的光束的有用区域的啮合，以及第二相位基函数，其形成 两个光束笔之间的相位相对离开了排除光栅的相邻网格。

    Spectral band-pass filter having high selectivity and controlled polarization
    9.
    发明授权
    Spectral band-pass filter having high selectivity and controlled polarization 有权
    具有高选择性和受控极化的光谱带通滤波器

    公开(公告)号：US09052454B2

    公开(公告)日：2015-06-09

    申请号：US13824807

    申请日：2011-09-15

    Applicant: Grégory Vincent ,  Riad Haidar ,  Stéphane Collin ,  Jean-Luc Pelouard

    Inventor： Grégory Vincent ,  Riad Haidar ,  Stéphane Collin ,  Jean-Luc Pelouard

    IPC: G02B5/18 ,  G01J3/28 ,  G02B5/20 ,  B82Y20/00

    CPC classification number: G02B5/203 ,  B82Y20/00 ,  G01J3/28 ,  G02B5/1809 ,  G02B5/201 ,  G02B5/204 ,  G02B2207/101

    Abstract: According to one aspect, the invention relates a spectral band-pass filter, which is optimized for the transmission of an incident wave at at least a first given central wavelength λ0, and which includes: a metal grating having a thickness (t) greater than approximately λ0/50 and including at least a first set of substantially identical, parallel slots having a width (W) less than around λ0/10, and being spaced apart periodically or quasi-periodically according to a first period that is less than said first central wavelength, a layer of dielectric material having a thickness (h) and a given refractive index (ng), which is coupled to the metal grating to form a waveguide for the waves diffracted by the grating, said first period of the grating being designed such that only orders 0 and ±1 of a wave having normal incidence and a wavelength λ0 are diffracted in the layer of dielectric material, the assembly of the dielectric layer and grating being suspended, during use, in a fluid having a refractive index of close to 1.

    Abstract translation: 根据一个方面，本发明涉及一种频谱带通滤波器，其被优化用于在至少第一给定中心波长λ0处的入射波的透射，并且其包括：厚度（t）大于 大约λ0/50并且包括具有小于约λ0/ 10的宽度（W）的至少第一组基本上相同的并行槽，并且根据小于所述第一和第二周期的第一周期周期性地或准周期地间隔开 中心波长，具有厚度（h）和给定折射率（ng）的介电材料层，其被耦合到所述金属光栅以形成用于由所述光栅衍射的波的波导，所述光栅的所述第一周期被设计 使得仅在电介质材料层中衍射具有正入射波长和波长λ0的波的0和±1阶，电介质层和光栅的组装在使用期间被悬浮在流体中 折射率接近1。

    SPECTRAL BAND-PASS FILTER HAVING HIGH SELECTIVITY AND CONTROLLED POLARIZATION
    10.
    发明申请
    SPECTRAL BAND-PASS FILTER HAVING HIGH SELECTIVITY AND CONTROLLED POLARIZATION 有权
    具有高选择性和控制极化的光谱带通滤波器

    公开(公告)号：US20130228687A1

    公开(公告)日：2013-09-05

    申请号：US13824807

    申请日：2011-09-15

    Applicant: Grégory Vincent ,  Riad Haidar ,  Stéphane Collin ,  Jean-Luc Pelouard

    Inventor： Grégory Vincent ,  Riad Haidar ,  Stéphane Collin ,  Jean-Luc Pelouard

    IPC: G02B5/20 ,  G01J3/28

    CPC classification number: G02B5/203 ,  B82Y20/00 ,  G01J3/28 ,  G02B5/1809 ,  G02B5/201 ,  G02B5/204 ,  G02B2207/101

    Abstract: According to one aspect, the invention relates a spectral band-pass filter, which is optimized for the transmission of an incident wave at at least a first given central wavelength λ0, and which includes: a metal grating having a thickness (t) greater than approximately λ0/50 and including at least a first set of substantially identical, parallel slots having a width (W) less than around λ0/10, and being spaced apart periodically or quasi-periodically according to a first period that is less than said first central el wavelength, a layer of dielectric material having a thickness (h) and a given refractive index (ng), which is coupled to the metal grating to form a waveguide for the waves diffracted by the grating, said first period of the grating being designed such that only orders 0 and ±1 of a wave having normal incidence and a wavelength λ0 are diffracted in the layer of dielectric material, the assembly of the dielectric layer and grating being suspended, during use, in a fluid having a refractive index of close to 1.

    Abstract translation: 根据一个方面，本发明涉及一种频谱带通滤波器，其被优化用于在至少第一给定中心波长λ0处的入射波的透射，并且其包括：厚度（t）大于 大约λ0/ 50并且包括具有小于约λ0/ 10的宽度（W）的至少第一组基本上相同的并行槽，并且根据小于所述第一和第二周期的第一周期周期性或准周期性地间隔开 中心el波长，具有厚度（h）和给定折射率（ng）的电介质材料层，其被耦合到金属光栅以形成用于由光栅衍射的波的波导，光栅的所述第一周期为 被设计为使得只有在正常入射波长和波长λ0的波中的0和±1的阶数在电介质材料层中衍射，电介质层和光栅的组装被暂停 在使用折射率接近1的流体中。

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