公开(公告)号：US20240296539A1

公开(公告)日：2024-09-05

申请号：US18572687

申请日：2022-07-01

Applicant: Randox Laboratories Ltd.

Inventor： Deepesh UPADHYAY ,  Peter FITZGERALD ,  Ivan MCCONNELL

IPC: G06T7/00 ,  H04N23/56 ,  H04N23/695

CPC classification number: G06T7/0004 ,  H04N23/56 ,  H04N23/695 ,  G06T2207/30072

Abstract: There is provided a vision system for assessing defects on biochips and a corresponding method. The vision system comprises an imaging region in which a biochip sheet including at least one biochip is locatable in use: an imager arranged in use to image at least a portion of the imaging region, wherein, when the biochip sheet is located in the imaging region. the portion includes at least a face of the biochip sheet: and an illumination source arranged in use to direct illumination on to the face the biochip sheet. thereby illuminating defects on the at least one biochip when a mask material layer is present on the at least one biochip and when a mask material is absent and allowing the defects to be included in the imaged at least a portion of the imaging region.